1. FRANK LABORTORY OF NEUTRON PHYSICS ION BEAM ANALYSIS
1. Diale Boitshoko Phenyo (UWC)
2. Sefage Amanda (UZ)
3. Nkosi Steven (CSIR)
Republic of South Africa
Supervisor: A.P. Kobzev (JINR, Dubna)
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2. VAN DE GRAAFF ACCELERATOR EG-5
Main Characteristics
Energy region MeV
Energy spread less than 500eV
Beam intensity 10µA for He and
30µA for H.
Types of ions used
4He+ and H+
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3. ACCELERATOR EG-5
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4. ANALYTICAL METHODS Rutherford Backscattering Spectrometry (RBS)
Elastic Recoil Detection Analysis (ERDA)
Particle Induced X-ray Emission (PIXE)
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5. PRINCIPLE OF RBS KINEMATIC FACTOR Atomic mass of target. Z
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6. SCATTERING CROSS SECTION
Z1 - Atomic number of incident particle
Z2 - atomic number of target
M1 – Atomic mass of incident particle
M2 – Atomic mass of target
Ѳ - Scattering angle
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7. PRINCIPLE OF RBS Ω + θ1 θ θ2 Stopping cross section x Detector
E0, Z1, M1 + x
N-Number of particles in the layer ΔX θ1
-Energy loss per unit length θ θ2
E1, Z2, M2 Ω
Detector
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8. RBS EXPERIMENTAL RESULTS
Layer
Element
Conc. (at.%) 1
Niobium
100 2
Titanium 79
Oxygen 21 3
Silicon
Intensity(arb.)
A = σΩ .Q . Nt
A – total number of detected particles
Q – total no. of inc. Particles
Nt – no. of target atoms per unit area
Channel number
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9. RBS EXPERIMENTAL RESULTS
Layer
Element
Thickness (nm) 1
Titanium
418 2
Niobium
254 3
Silicon
2 mm
Channel number
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10. RBS EXPERIMENTAL RESULTS
Layer
Element
Conc.at%
Thickness (nm) 1
Titanium 80
Carbon 10
180
Oxygen 2 40
42.3
Silicon 50 3
100
2 mm
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11. PRINCIPLE OF ELASTIC RECOIL DETECTION ANALYSIS
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12. ERDA-RESULTS Counts Element Conc. (%) Thickness = 2600E+15 at./cm2
H ydrogen 35
C arbon
Silicon 30
Thickness = 2600E+15 at./cm2
Counts
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13. ERDA – RESULTS cont,d Thickness = 1570E+15 at./cm2 Channel number
Element
Conc. (%)
H ydrogen 26
C arbon 60
O xygen 14
Thickness = 1570E+15 at./cm2
Channel number
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Channel number

14. PRINCIPLE OF PIXE
Characteristics X-rays
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15. PRINCIPLE OF PIXE
Characteristics X-rays
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16. PRINCIPLE OF PIXE Moseley law Rc – Rydberg’s constant
Z – atomic number
Sn – screening constant
n – main quantum number
ν - frequency of X-ray quantum
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17. CALIBRATION
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18. AEROSOL ANALYSIS BY PIXE & RBS
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19. AEROSOL ANALYSIS BY PIXE & RBS
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20. AEROSOL ANALYSIS BY PIXE & RBS
Element
Concen. At. %
Method C 41
RBS K
0.1
PIXE N
20.5 Ca
0.53 O 28 Mn
0.007 F
2.6 Fe
0.14 Na
2.5 Cu
0.002 Mg
1.3 Zn
0.01 Al As
0.001 Si
1.8 Sr
0.0006 S
0.2 Zr
0.005 Cl Ba
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21. CONCLUSION
Non-destructive methods ( Different fields i.e. Electronic devices , Multi layer-structures, geologist, archaelogist etc)
Determine structure and composition of materials
Elemental analysis
Elemental concentration, depth profile in thin films ( < 1 at.%)
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22. CONCLUSION cont.d Ti Nb 30 10 1800 1500 264 169,5 2x10xx16 1x10xx16
ELEMENT Ti Nb
MINIMUM THICKNESS, nm 30 10
MAXIMUM THICKNESS, nm
1800
1500
REAL THICKNESS, nm
264
169,5
SENSITIVITY, at/cm2
2x10xx16
1x10xx16
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23. Siyabonga
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