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TD24 R05 N1 after high-power test analysis plans A. Degiovanni, M. Aicheler, N. Mouriz Irazabal, A.T. Perez Fontenla, R. Wegner CLIC RF Structure Development.

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Presentation on theme: "TD24 R05 N1 after high-power test analysis plans A. Degiovanni, M. Aicheler, N. Mouriz Irazabal, A.T. Perez Fontenla, R. Wegner CLIC RF Structure Development."— Presentation transcript:

1 TD24 R05 N1 after high-power test analysis plans A. Degiovanni, M. Aicheler, N. Mouriz Irazabal, A.T. Perez Fontenla, R. Wegner CLIC RF Structure Development Meeting 23/04/2014

2 Outline History of the structure:  EDMS: 1258457 – traveller of structure  EDMS: 1239394 – RF tuning (22-24.08.2012, Vasim+Rolf)  EDMS: 1306038 – post high power operation analysis Observations:  detuning of coupling cells (last cell frequency decrease, opposite to T(D)18)  hot cell developed during high power operations (  Wilfrid’s analysis) What needs to be done? 1.metrology measurements (for better understanding detuning effect) 2.hot cells analysis (BD distribution) 3.B-arc features (EDMS: 1096980, TD18 KEK/SLAC post mortem observations) 4.samples (octant/quadrant) for collaborators Possible cutting methods Proposal(s) for TD24 23/04/20142

3 Cells nomenclature 1: input coupler 26: output coupler 5 2: first regular cell 25: last regular cell 23/04/20143

4 Cells nb. 8h. Records nb. time 3 8 13 18 23 1 5 TD24R05 normalized BD distribution Hot cells (5 and 6) have appeared from record #50 The very high peak values are an artifact of the normalization (if only 2 BDs during a record these cells will result very active) 23/04/20144

5 Comparison of Beadpull measurements 23/04/20145 Re  coupling; little changes Im  detuning; strong 25,26; some 1,2 Preliminary RF measurements analysis of TD24 from CLEX, Rolf Wegner, 14.08.2013

6 Comparison of detuning of different structures T18 SLAC N1TD18 SLACT24 SLACT18 CERN N2TD24 CLEXTD24 R05 N1 XBox1 Analysed atSLAC CERN byJ.W. J.S.R.W. Output matching Standing Wave (VSWR)1.061.221.051.111.051.15 R [%] 3.0102.55.02.67.0 R [dB]-30-20-32-26-32-23 df end [MHz]+2.0+7.0+2.5+3.0+0.1-2.2 df end-1 [MHz] +1.0+1.7 Regular cells Total phase shift [°] -166 -9.2~ -6 avg(df) [MHz] +1.0-0.3 +0.4+0.2 std(df) [MHz] +0.2+0.3 notes  19  20 ~ 100° structure retuned Rolf Wegner 23/04/20146

7 Cutting methods Turning and ripping apart Milling and grooving Abrasive saw cutting Water-jet cutting Wire Electrical Discharge Machining (EDM) 23/04/20147 Sawing

8 Cutting methods Cutting method Cutting issues Indicated for type… Example 1Saw High deformation High velocity chips and pollution* into the cavity (*The pollution due to cooling liquids could be reduced or even suppressed) damped TD18 KEK/SLAC 2 2.a Milling- 2.b Turning (and ripping apart) Very clean method (for undamped only) Possible small deformation undamped T18 KEK/SLAC 3 Wire EDM cut (Electrical Discharge Machining) No deformation Sparks in the cutting plane and possible oxidation; Pollution into the cavity (de-ionized water) Damped/ undamped T18 CERN 23/04/20148

9 Cutting methods Cutting method Cutting issues Indicated for type… Example Metrology check BD distribution on iris SEM chemical analysis Detailed SEM exploration 1Saw High deformation High velocity chips and pollution* into the cavity (*The pollution due to cooling liquids could be reduced or even suppressed) damped TD18 KEK/SLAC nodifficult 2 2.a Milling- 2.b Turning (and ripping apart) Very clean method (for undamped only) Possible small deformation undamped T18 KEK/SLAC limitedyes 3 Wire EDM cut (Electrical Discharge Machining) No deformation Sparks in the cutting plane and possible oxidation; Pollution into the cavity (de-ionized water) Damped/ undamped T18 CERN yes no could be affected by pollution 23/04/20149

10 Cutting methods Cutting method Cutting issues Indicated for type… Example Metrology check BD distribution on iris SEM chemical analysis Detailed SEM exploration 1Saw High deformation High velocity chips and pollution* into the cavity (*The pollution due to cooling liquids could be reduced or even suppressed) damped TD18 KEK/SLAC nodifficult 2 2.a Milling- 2.b Turning (and ripping apart) Very clean method (for undamped only) Possible small deformation undamped T18 KEK/SLAC limitedyes 3 Wire EDM cut (Electrical Discharge Machining) No deformation Sparks in the cutting plane and possible oxidation; Pollution into the cavity (de-ionized water) Damped/ undamped T18 CERN yes no could be affected by pollution 4 Abrasive saw slow cutting Slow rotation speed implies long time (~days) «clean» method No deformation Damped/ undamped Never done before Aquistion of suitable machine... yes maybe 5 Water jet cutting No deformation Pollution into the cavity Damped/ undamped Never done before yes no could be affected by pollution 23/04/2014 10

11 Cutting issues copper-air transition due to the damping waveguides iris thickness + holes for dimple tuners length of the structure for rotating support … 23/04/201411

12 5 Overall cutting scheme for TD24 Remove the flanges transverse cutting of the two extremities longitudinal cut for metrology of input and output coupler slicing of cells number 4-5-6&21-22-23 for iris inspection (cut of central cells 12-14 and metrology check for comparison with couplers) 23/04/201412

13 5 Cutting scheme 1 for TD24 1.Remove the flanges by EDM 2.transverse cutting of the two extremities by EDM 3.longitudinal cut for metrology of input and output coupler by EDM 4.slicing of cells number 4-5-6&21-22-23 for iris inspection by EDM 5.(cut of central cells 12-14 as for step 2 and 3) 23/04/201413

14 5 Cutting scheme 2 for TD24 1.Remove the flanges by mechanical sawing 2.transverse cutting of the two extremities by mechanical sawing 3.longitudinal cut for metrology of input and output coupler by EDM 4.slicing of cells number 4-5-6&21-22-23 for iris inspection by mechanical sawing 5.(cut of central cells 12-14 as for step 2 and 3) 23/04/201414

15 5 Cutting scheme 3 for TD24 1.Remove the flanges by mechanical sawing 2.transverse cutting of the two extremities by milling/turning and ripping apart 3.longitudinal cut for metrology of input and output coupler by EDM 4.slicing of cells number 4-5-6&21-22-23 for iris inspection by milling/turning and ripping apart 5.(cut of central cells 12-14 as for step 2 and 3) 23/04/201415

16 5 Cutting scheme 4 for TD24 1.Remove the flanges by mechanical sawing 2.transverse cutting of the two extremities by abrasive low speed sawing 3.longitudinal cut for metrology of input and output coupler by EDM 4.slicing of cells number 4-5-6&21-22-23 for iris inspection by abrasive low speed sawing 5.(cut of central cells 12-14 as for step 2 and 3) 23/04/201416

17 Conclusion and discussion Desired measurements: – Metrology on input and output coupler to better understand the observed frequency shift – BD distribution on cell 5 and adjacents to find and locate possible hot spot – other possible surface exploration and analyses (also samples to collaborators) Four proposed options to be chosen from Do we want to study the option of a low speed abrasive saw? Do we want to study the option of the water jet cutting? STEPoption 1option 2option 3option 4 1 removing the flanges EDM mech. sawing 2 transverse cutting EDM mech. sawing milling/ turning abrasive slow sawing 3 longitudinal cutting EDM 4 slicing of cells 4-5-6&21-22-23 EDM mech. sawing milling/ turning abrasive slow sawing 23/04/201417

18 THANK YOU FOR YOUR ATTENTION 23/04/201418

19 From presentation 14/08/2013 http://indico.cern.ch/event/245698/ http://indico.cern.ch/event/245698/ 23/04/201419 re-tuning of last 2 cells (25, 26) ? pro: clearer picture of detuning of regular cells contra: cell 26 detuned in opposite direction than previous structures. Why? Re-tuning could cover tracks. investigations by cutting, metrology, SEM, etc. geometry changes of last cells => why df 26 = +2 MHz and df 25 = -1.7 MHz investigation of cell 24 (higher dS 11local ) investigation of input side – cells 1, 2 – similar effect as on output side? investigation of cells 4, 5, 6 (slightly abnormal dS 11local, hot cell in this region)

20 https://edms.cern.ch/file/1093645/2/CLIAAS120079_-_ASSEMBLY.pdf TD24_vg1.8_R05 input ports 23/04/201420

21 https://edms.cern.ch/file/1093645/2/CLIAAS120077_-_STANDARD_CELL.pdf 23/04/201421


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