1. FLUKA Rechnungen für das CBM Experiment an FAIR
Anna Senger
CBM Detektoren

2. Outlook FLUKA tool and radiation environment predictions
The CBM experiment
FLUKA calculations for the CBM detector development
Conclusions
FLUKA
"The FLUKA code: Description and benchmarking" G. Battistoni, S. Muraro, P.R. Sala, F. Cerutti, A. Ferrari, S. Roesler, A. Fasso`, J. Ranft, Proceedings of the Hadronic Shower Simulation Workshop 2006, Fermilab 6--8 September 2006, M. Albrow, R. Raja eds., AIP Conference Proceeding 896, 31-49, (2007)
"FLUKA: a multi-particle transport code" A. Fasso`, A. Ferrari, J. Ranft, and P.R. Sala, CERN (2005), INFN/TC_05/11, SLAC-R-773
FLAIR
V.Vlachoudis "FLAIR: A Powerful But User Friendly Graphical Interface For FLUKA“ Proc. Int. Conf. on Mathematics, Computational Methods & Reactor Physics (M&C 2009), Saratoga Springs, New York, 2009

3. FLUKA
FLUKA is a general purpose tool for calculations of particle transport and interactions with matter, covering an extended range of applications spanning from proton and electron accelerator shielding to target design, calorimetry, activation, dosimetry, detector design, Accelerator Driven Systems, cosmic rays, neutrino physics, radiotherapy etc.
Transport limits: Secondary particles Primary particles
charged hadrons keV-20 TeV * keV-20 TeV * **
neutrons thermal-20 TeV * thermal-20 TeV *
antineutrons keV-20 TeV * MeV-20 TeV *
muons keV-1000 TeV keV-1000 TeV **
electrons keV-1000 TeV keV-1000 TeV (low-Z materials) **
150 keV-1000 TeV (high-Z materials) **
photons eV-1000 TeV keV TeV
heavy ions <10000 TeV/n <10000 TeV/n
* upper limit 10 PeV with the DPMJET interface
** lower limit 10 keV in single scattering mode
thermal ~ 10-5 eV

4. MATERIAL CAUSE RADIATION EFFECT
Radiation Effects
MATERIAL CAUSE RADIATION EFFECT
Semiconductors Electron-hole pair dose ionization
Photon interaction photon absorption
Lattice displacement nuclear collision
Polymers Main and side chain rupture dose ionization
cross-linking degradation dose ionization
gas evolution, radical production dose rate
Ceramics Lattice displacements nuclear collision
trapped charge carriers dose ionization
color centers dose ionization
Metals Lattice displacements nuclear collision
nuclear reactions producing clusters nuclear collision voids and bubbles nuclear collision

5. Radiation environment during the experiments
Dose in shielded areas (where the electronics is usually located) is mainly due to neutrons (and associated photons)
Dose and neutron fluxes have a very close correlation
Cumulative damage comes from
Energy deposition (ionizing dose)
Lattice displacement (1-MeV n equivalent particle fluxes)
Stochastic failures can occur (SEU) and are mostly due to “high” energy hadrons (“E>20 MeV”)
No safe limit exists, only a risk level can be determined
Risk level for commercial electronics is poorly known and varies by orders of magnitude between different devices and series
Only a combination of the following can assure safe operation:
Simulation studies of related radiation levels (Dose, 1MeV, 20MeV)
Careful selection and testing of required electronics
Shielding and displacement considerations

6. Radiation Effects microscopic effect (detectors)
Displacement Damage. Hadrons can interact and cause significant damage to the crystal lattice. The amount and type of damage depends on the particle type and energy. The damage is usually quantified by the amount of Non-Ionizing Energy Loss
Ionizing Radiation is of high energy, capable to penetrate in the matter, to produce ionization of the atoms and to break chemical bonds.
macroscopic effect
(electronics)

7. CBM experiment @ FAIR STS MuCh TRD ToF PSD MVD + STS RICH TRD ToF ECAL
Experimental tasks and detector systems
tracking, momentum determination, vertex reconstruction: silicon pixel/strip detectors (MVD+STS) in a magnetic dipole field
hadron identification: Time-of-Flight (ToF) measurements
lepton identification: Muon detection system, RICH, TRD and ECAL for electrons (alternative measurements)
determination of collision centrality and event plane: projectile spectator detector (PSD)
high speed DAQ and online event selection
STS
MuCh
TRD
ToF
PSD
MVD +
STS
RICH
TRD
ToF
ECAL
PSD
Experimental and technical challenges
high multiplicities (up to 1000 particles per reaction)
high reaction rates (up to 10 MHz)

8. FLUKA CBM geometry CBM @ SIS300 full setup CBM @ SIS100 start version
side view
TRD
ToF
SIS300
full setup
vacuum
beam pipe
MVD +
STS
PSD
RICH
FLAIR
side view
SIS100
start version
ToF
TRD
MVD +
STS
PSD
He bags
RICH
FLAIR

9. CAVE Non-Ionizing Energy Loss (NIEL) CBM @ SIS300 CBM @ SIS100 vacuum
SIS100: 10 GeV/u, 109 Au/s
SIS300: 35 GeV/u, 109 Au/s
Non-Ionizing Energy Loss (NIEL)
neq/cm2/2months
side view
vacuum
beam pipe
SIS300
side view
SIS100
He bags

10. CAVE Ionizing dose CBM @ SIS300 CBM @ SIS100 vacuum beam pipe He bags
SIS100: 10 GeV/u, 109 Au/s
SIS300: 35 GeV/u, 109 Au/s
Ionizing dose
Gy/2months
side view
vacuum
beam pipe
SIS300
side view
SIS100
He bags

11. MVD Ionizing dose CBM @ SIS300 CBM @ SIS100 5 cm 10 cm 15 cm
SIS100: 10 GeV/u, 107 Au/s
SIS300: 35 GeV/u, 107 Au/s
Ionizing dose
5 cm
10 cm
15 cm
Gy/2months
SIS300
 10 cm
 18.6 cm
 22.8 cm
SIS100

12. MVD Non-Ionizing Energy Loss (NIEL) CBM @ SIS300 CBM @ SIS100 5 cm
SIS100: 10 GeV/u, 107 Au/s
SIS300: 35 GeV/u, 107 Au/s
Non-Ionizing Energy Loss (NIEL)
5 cm
10 cm
15 cm
neq/cm2/2months
SIS300
 10 cm
 18.6 cm
 22.8 cm
SIS100

13. STS Ionizing dose CBM @ SIS300 CBM @ SIS100 30 cm 100 cm
SIS100: 10 GeV/u, 107 Au/s
SIS300: 35 GeV/u, 107 Au/s
Ionizing dose
30 cm
100 cm
Gy/2months
SIS300
48  40 cm2
96  100 cm2
SIS100
electronics

14. STS Non-Ionizing Energy Loss (NIEL) CBM @ SIS300 CBM @ SIS100 30 cm
SIS100: 10 GeV/u, 107 Au/s
SIS300: 35 GeV/u, 107 Au/s
Non-Ionizing Energy Loss (NIEL)
30 cm
100 cm
neq/cm2/2months
SIS300
48  40 cm2
96  100 cm2
SIS100
electronics

15. Detector damages
1014 n/cm2
104 Gy

16. live time without/mild damages
Conclusions
estimated CBM detector live time (only for hot regions)
detectors
beam intensity (s-1)
live time without/mild damages
MVD
107
6 months *
STS
109
10 months *
RICH
2 years **
MuCh
6 months **
TRD
ToF
PSD
108
1 year **
* sensitive to the NIEL
** sensitive to the ionizing dose