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TEHNIKE UZORKOVANJA Sampling for paleontological and biostratigraphical analysis Source: BGR
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UZORKOVANJE NEVEZANOG SEDIMENTA
površinsko
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UZORKOVANJE RECENTNIH SEDIMENATA
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ISTRAŽIVAČKI BRODOVI
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JEZGROVANJE
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PODMORSKO GRABILO
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VAN VEEN-OVO GRABILO
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EKMANOVA DREĐA
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UZORKOVANJE PLANKTONA
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BOJENJE, ISPIRANJE, SUŠENJE, SPLITANJE, SPREMANJE
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splitanje (pačetvoranje) uzorka
određivanje sastava zajednice određivane biološke raznolikosti (bogatstvo vrsta, dominacija, Simpsonov, Shannonov, Fisher indeks) multivarijantna analiza (više varijabli, dendogrami sličnosti)
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TEHNIKE PRIPREME UZORAKA LABORATORIJSKA OBRADA
ČVRSTA STIJENA PREPARATI - TANKI IZBRUSCI
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prilozi - Mikropaleontologija I
TEHNIKE PROMATRANJA OPTIČKA POMAGALA prilozi - Mikropaleontologija I
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TRANSMISSION VERSUS SCANNING ELECTRON MICROSCOPY
TEM SEM Scanning Electron Microscope (SEM) 1: Electron cannon in the upper part of the column (here a so-called field-emission source). 2 Electro-magnetic lenses to direct and focus the electron beam inside the column. 3: Vacuum pumps system. 4: Opening to insert the object into the high-vacuum observation chamber in conventional SEM mode. 5: Operation panel with focus, alignment and magnification tools and a joystick for positioning of the sample. 6: Screen for menu and image display. 7: Cryo-unit to prepare (break, coat and sublimate) frozen material before insertion in the observation chamber in Cryo-SEM mode. 8: Electronics stored in cupboards under the desk. 9: Technicians Mieke Wolters-Arts and Geert-Jan Janssen discussing a view. Transmission Electron Microscope (TEM) 1: Electronen cannon in the upper part of the column. 2 Electro-magnetic lenses to direct and focus the electron beam inside the column. 3: Vacuum pumps system. 4: Opening to insert a grid with samples into the high-vacuum chamber for observation. 5: Operation panels (left for alignment; right for magnification and focussing; arrows for positioning the object inside the chamber). 6: Screen for menu and image display. 7: Water supply to cool the instrument.
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TEM makes high-resolution (± 1 nm) views of the inner side of objects
TEM makes high-resolution (± 1 nm) views of the inner side of objects. Mostly TEM is applied on material (e.g. cells) that has been previously 'stained' and cut into ultrathin sections, but sometimes also intact objects < 1 µm, like virusses and aggregates of macromolecules, are visualized. In SEM the image primary electrons from the source bombard the sample according to a scanning pattern and cause emission of secondary electrons. In SEM an image of the surface of the object is made.
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KATODOLUMINISCENCIJA
cathodoluminescence (CL) microscope combines methods from electron and regular (light optical) microscopes. It is designed to study the luminescence characteristics of polished thin sections of solids irradiated by an electron beam.
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