1. Nano-electronics Vision: Instrumentation and methods for analysis of atomic scale physical properties, and methods to correlate these properties with nano-electronic device and system performance.

2. Nano-electronics: hard problems Spatially resolved characterization (1-, 2-, and 3-D as appropriate) of physical properties, ranging from nanometer to atomic scale: –Physical properties of interest include chemical composition, electrical, thermal, structural, mechanical and optical properties. Hierarchical multiscale modeling methods to correlate measured physical properties with device electrical properties. Standardized methods/models for analysis of metrology data. For manufacturing these metrologies should be: –Statistically significant and determine nano-property distribution over the chip, across the wafer, and wafer to wafer. –Compatible with the high-throughput, high-sensitivity, non-destructive, and low-cost, environment of semiconductor manufacturing

3. Industrial sectors with significant R&D and products in nanotechnology Telecommunications Chemicals/catalysis Homeland security Transportation Life Sciences Electronics Coatings Defense Sensors Energy

4. Nanophotonics Grand Challenge Vision (I) Vision: Design, model, and synthesize materials and devices for optoelectronics,data storage, efficient light sources, optical computing, and biomedical instrumentation Develop instrumentation and techniques for nanoscale 3D imaging, chemical analysis, and material manipulation in hard and soft materials Hard Problems: Interface control in heterogeneous materials synthesis Integration of device and materials with different properties and functionalities Challenges in sub-surface and 3D imaging from nano to meso scale New components and devices that improve signal, speed, and resolution by orders of magnitude Realistic 4D modeling of entire optical systems below the diffraction limit Precision measurements of materials optical properties over wide range of conditions

5. Nanophotonics Grand Challenge Vision (II) Industrial benefits : High throughput, high yield nano-manufacturing New methods in optical communications Bio-medical in-vivo sensors and diagnosis Low-cost, long-duration light sources and detectors General public impacts: High-security, low-power, high-speed communications New bio-medical knowledge enabling acceleration of drug discoveries New photodynamic therapies Homeland security: sensors for bio/chemical detection

6. Nanomagnetics Grand Challenges Measurement of magnetic properties of one cn (cubic nm) of material. Imaging of spin dynamics at the nano- scale with sub-ns time resolution Measurement of spin transport in materials (e.g. semiconductors)

7. Measurement of magnetic properties of one “cn” (cubic nm) of material. Measure 10 -17 emu (100 atoms) Measure inter- particle & inter–grain magnetic interaction with spatial resolution <1 nm –Exchange and magneto-static interactions Probe buried interfaces Probe structural and electronic properties of tunnel barriers Image magnetic polarization of 1 cn of material

8. Imaging of spin dynamics at the nano-scale with sub-ns time resolution 3D magnetization measurements Element specificity at < 10 nm resolution –Gives resolution better than exchange length Accurate modeling of selected probe techniques to analyze and direct research. Develop x-ray optics for photoemission, diffraction, and dichroism experiments

9. Measurement of spin transport in materials Develop Tools to measure spatial dependence of spin polarization in materials –Interfaces and nanostructured materials and bulk Develop Tools to measure spin transport and accumulation –Optical methods to generate and manipulate spin currents –Modeling to infer spin polarization

10. Applications Magnetic recording: density increased beyond 10 Tb/cm2 Permanent magnets: 4  M>2 kA/m Magnetic-RAM: in production –Nonvolatile, high speed, low power, “instant on” computers Improved field sensors: –Applications in military, biomedical, security

11. Combined Grand Challenge Develop instrumentation and methods for the measurement & analysis of atomic scale (1 cn) electronic, photonic, and magnetic properties, and methods to correlate these properties with nano- materials, devices and system performance.