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Published byAshlyn Price Modified over 9 years ago
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Controls-related R&D options Etienne CARLIER 18 th ABTEF meeting 27-06-2014
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Outline The challenge Possible R&D options Summary
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Just scaling does not work… 108 MKDs and 200 m TCDQ vs. availability/reliability W. Bartmann – 2014 TE-ABT Group Meeting
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PLC SIEMENS Ethernet PROFIBUS-DP / PROFINET Decentralised I/O Deported I/O Local Control TP Application Equipment Server Linux VME Linux CompactPCI Linux LoggingAlarmFixed Display Local Control Windows PXI LabRT Modules SCSS FIPSKITS FASS Generic ABT Control Architecture SCSS: State control & Surveillance System KITS: Kicker Timing Software FASS: Fast Acquisition Surveillance System FIPS: Fast Interlocking & Protection System Modules
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The Challenge (Simple Electronics & Controls view) Increase of number of equipment – Space Increase of equipment performance – Technology Increase of equipment complexity – Integration Increase of flexibility / adaptability – Modularity Increase of availability – Reliability
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Redundancy Reliability, Availability, Maintainability and Safety – Double and/or triple redundancy – Reconfigurable and/or degraded mode operation Failure mode – Monitoring, Monitoring, Monitoring Should be included at all levels in system design from the beginning – Pulse generator – Power electronic – Control
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Modularity Power triggering – From switch/application specific triggering system to generic & modular system (current/voltage) – Redundancy Power supplies – From generic capacitor charger to modular charger – Redundancy Hardware object – “Open” system – Same hardware with different functionalities through different embedded software
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Integration Reduction – Rack space / hardware size – Cabling Distributed control – Actuators/sensors “as close as” possible to pulsed generators... i.e. up to embedded inside individual power component – Distributed “intelligence” Constraints – Space – Fieldbuses – Rad-hard electronics – Powering
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EMC Integration – Electronic inside pulsed generators / power components – Control and power electronic in same “module”... in same PCB Reduction of analog coupling – Common Bonding Network – Radiated – Conducted Emission and Immunity – Characterization – Measure – Test
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Software Human Machine Interface – Integrated – Easy access to data to experts – Full diagnostic in case of failure – Automated fault identification sequences From “Post Operational Check” to “Real-Time Check” – Slow degradation detection – Transient / instabilities detection – Intelligent system to correlate analysis
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Technology Signal acquisition – More bits.... at higher sampling rate. Challenging! – Form-factor.... Future a “PC” based hardware – Hardware and software synchronization in distributed system Signal analysis – Offline – Embedded Pulse to pulse regulation – Fuzzy logic – Neural network
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Summary “Embedded” redundancy In-depth pulse generator, power electronics and equipment controls integration Improve EMC integration Modularity... mainly in power electronic Real-time distributed low level control Expert system for feedback loop, failure analysis...
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