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1 BULK Si (100) VALENCE BAND STRUCTURE UNDER STRAIN Sagar Suthram Computational Nanoelectronics Class Project - 2006
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2 Outline Brief history of MOSFET scaling and need for Strained Silicon. Understanding Strain. Si valence band structure calculation using k.p method. Si valence band structure calculation using tight binding method. Strain effects on Si valence and conduction band – qualitative picture. Summary
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3 MOSFET Scaling History Si MOSFET first demonstrated in SSDRC in 1960. Improved dramatically due to gate length scaling driven by Increased density and speed Lower costs Power improvements Semiconductor industry scaled the MOSFET channels based on Moore’s law (1965). Simple geometric scaling followed. Constant field scaling introduced by Dennard et. al. (1974).
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4 MOSFET Scaling History Constant field scaling too restrictive Subthreshold nonscaling Power-supply voltage not scaled proportional to channel length Generalized scaling is preferable which allows oxide field to increase Shape of 2-D electric field pattern preserved (channel doping engineering) Short channel effects do not become worse
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5 MOSFET Scaling Limits But conventional planar bulk MOSFET channel length scaling is slowing Increased off-state leakage Increased off-state power consumption Degraded carrier mobility due to very high vertical fields (thin oxides <2nm) Lithographic limitations Little improvement in switching performance Inability to scale supply voltage and oxide thickness
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6 Continued Transistor Scaling “No exponential is forever” – Gordon Moore But present scaling limits for Si MOSFET are caused by materials and device structure and are not hard quantum limits Continued scaling requires new materials and device structures High –K dielectrics Strained Si Novel channel materials (Ge, III-V semiconductors) Non classical CMOS devices (FinFETs etc.)
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7 Strained Silicon Strained Silicon has been adopted in all advanced logic technologies Scalable to future generations Easily incorporated in existing processes Enhances performance even in the ballistic regime due to effective mass reduction 90nm INTEL Technology node transistor with process induced uniaxial stress [Thompson 04]
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8 How is strain added to silicon ? Uniaxial stress is induced in the following ways SiGe source-drain for PMOS Tensile nitride capping layer for NMOS
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9 How is strain added to silicon ? Biaxial stress is induced by epitaxialy growing a silicon layer on relaxed SiGe. The lattice mismatch induces biaxial tensile stress in the silicon layer.
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10 Outline Brief history of MOSFET scaling and need for Strained Silicon. Understanding Strain. Si valence band structure calculation using k.p method. Si valence band structure calculation using tight binding method. Strain effects on Si valence and conduction band – qualitative picture. Summary
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11 Understanding Strain Stress ( ) : Strain ( ) :
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12 Understanding Strain Elastic Stiffness Coefficients Elastic Compliance Coefficients
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13 Outline Brief history of MOSFET scaling and need for Strained Silicon. Understanding Strain. Si valence band structure calculation using k.p method. Si valence band structure calculation using tight binding method. Strain effects on Si valence and conduction band – qualitative picture. Summary
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14 Silicon valence band using k.p The form of the Schrodinger equation when written in terms of u nk (r) near a particular point k 0 of interest.
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15 Silicon valence band using k.p Luttinger-Kohn’s model: k.p method for degenerate bands Mainly for silicon valence bands Consider the heavy hole, light hole and split-off bands as class A and rest of the bands as class B Use 2 nd order degenerate perturbation theory
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16 Luttinger-Kohn Hamiltonian
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17 Valence Band structure
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18 Valence Band structure
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19 Valence Band structure
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20 Outline Brief history of MOSFET scaling and need for Strained Silicon. Understanding Strain. Si valence band structure calculation using k.p method. Si valence band structure calculation using tight binding method. Strain effects on Si valence and conduction band – qualitative picture. Summary
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21 Silicon Valence band using tight-binding method pxpx pypy pzpz sp3s* tight binding picture used 20x20 Hamiltonian including spin-orbit interaction considered Silicon valence band predominantly composed of p- bonding states which are degenerate at the point
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22 Tight binding Band structure
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23 Tight binding Band structure
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24 Outline Brief history of MOSFET scaling and need for Strained Silicon. Understanding Strain. Si valence band structure calculation using k.p method. Si valence band structure calculation using tight binding method. Strain effects on Si valence and conduction band – qualitative picture. Summary
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25 Strain effects on silicon valence band Splits the degeneracy of the valence band at the point The bands are no longer just HH or LH due to the strong coupling between the two, but either HH-like or LH-like Biaxial stress does not warp the bands much due to the presence of only a hydrostatic component in the strain matrix which maintains the crystal symmetry. Uniaxial stress warps the bands causing a reduction in the effective mass due to the presence of a shear term which destroys the crystal symmetry
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26 Summary k.p method is emperically based and treats the band structure with precision k.p is useful for calculating band structure only for k values close to the band edge which is generally the region of interest Tight-binding on the other hand considers the microscopic interatomic interactions and hence gives a good physical insight into the strain effects on the band structure We see differences in the exact band structures computed by the two methods but they show similar trends under the application of strain Computing more accurate band structures with the tight-binding method involves consideration of up to 10 orbitals (sp3d5s*) along with spin which gets very complicated when the strain effect is added Thank You
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