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In-situ Resistivity Measurement during Annealing and Transmission Electron Microscopy – an Efficient Method of Investigation of Phase Transformation in.

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Presentation on theme: "In-situ Resistivity Measurement during Annealing and Transmission Electron Microscopy – an Efficient Method of Investigation of Phase Transformation in."— Presentation transcript:

1 In-situ Resistivity Measurement during Annealing and Transmission Electron Microscopy – an Efficient Method of Investigation of Phase Transformation in Al Alloys M. Cieslar 1, M. Slámová 2, M. Hájek 1, J. Veselý 1 1 Charles University in Prague, Faculty of Mathematics and Physics, Ke Karovu 5, 121 16 Prague 2, Czech Republic 2 VÚK Panenské Břežany, s.r.o., Panenské Břežany 50, 250 70 Odolena Voda, Czech Republic

2 Properties changes in materials 1. Changes of integral properties 2. The role of microstructure

3 Integral experimental techniques DSC (DTA) Hardness test Tensile test (compression) … Resistivity measurements

4 Microstructure observations Light microscopy X-ray diffractometry Scanning electron microscopy Transmission electron microscopy

5 Complex information Suitable combination of integral and microstructural methods

6 Aluminium alloys Resistivity measurement Hardness test Light microscopy SEM TEM

7 Resistivity measurements Matthiessen’s rule  (T)=  m (T) +  d  m (T) … scattering on phonons  d … residual resistivity

8 Residual resistivity  d =  k k=kckk=kck c k … concentration (density, volume fraction, …) of defects  k … concentration and temperature independent constant

9 Deviations from Matthiessen’s rule  k is not a constant 1.Concentration 2.Temperature 3.Configuration

10 Electrical resistivity methods Residual resistivity measurement (  d ) in liquid nitrogen In-situ resistivity measurements during linear heating (  (T)=  m (T) +  d )

11 Twin-roll-cast AW-3003 alloys Influence of Si content and prestrain

12 Effect of Mn, Si content and prestrain  = 0.5 (F5, S5, Z5)  = 3.9 (F04, S04, 04)

13 Hardness measurements  = 0.5 (F5, S5, Z5)  = 3.9 (F04, S04, 04)

14 Microstructure (TEM) Deformation substructure in as-rolled Z04 Deformation substructure in the initial state of the S5 specimen First precipitates in the partially recovered substructure of the S5 specimen annealed to 320°C

15 Microstructure evolution I Precipitates in the S5 specimen annealed up to 450°C Inhomogeneous precipitation in the Z5 specimen annealed up to 450°C Coarsening and partial redissolution of phases in the S5 specimen annealed up to 620°C

16 Integral methods

17 Interpretation First minimum: Transformation of primary phases Second minimum: Precipitation of Al 6 (FeMn) phase and cubic  -AlFeMnSi phase on (sub)grain boundaries Third minimum: precipitation of phases in the (sub)grain interior


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