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Qualification Test of UFE Board Schematic diagram of UFE Board types and current status Qualification test procedures VA & UFE test setup Test results Conclusion C. H. Chung AMS TRD eeting, July 16 ~17. 2002 @CERN
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Schematic Diagram of UFE VA32 HDR12 Preamp. Shaping Multiplexing Peak. T = 2.4 s Power:55mW Applied Power HCC Chip 12 bit ADC AD7476
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UFE Board Types UFE45M21UFE45S17 UFE90S96 UFE90M18 UFE development made up to the present ADC Op. Amp VA
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Test Procedures Measurements : Gain, Pedestals, Noise, Linearity, Connectivity VA Hybrid UFE w.o VA Peaking Time = 2.4 s Gain = 2.0 [ADC counts / fC] Pedestals and Noise All channels within 1% of the mean gain All channels within 3% non-linearity Connection test with external CAL Production More Qualification Tests Mechanical Vibration Thermo Vacuum EMI
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VA Hybrid Test Setup VA-DAQ setup * IDE Co. * Type of VA-chip: VA32HDR12 * Number of channels/chip: 32 * Number of chips/board: 1 * Value (pF) of calibration capacitor:10.00E+0 Labview w. ROOT VA DAQ PCB and Adapter board
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VA Test Results(1) Peaking time & Linearity / channel Signal waveform of channel Oscilloscope Gain fitting vs. input charge
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VA Test Results (2)
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VA Test Results (3) Click to add text Typically all channels within 1% of the mean gain Mean = 1.198 [mV/fC], Sigma = 0.00337
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UFE Board Test Setup Board Box Block diagram of DAQ system Control signal WIN NT CVI, ROOT Real mode : Pedestal and Noise CAL mode : Gain and Nonlinearity 4m
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UFE Test Results (1) One Channel Pedestals and Gain linearity Noise = 1.705 ADC counts Gain = 2.01 [ADC counts/fC] MIP signal in TRD = 55 [fC] @80% Xe + 20%CO 2, gain = 3000(3.5 10 5 e-) S/N = 55/0.86 = 64
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UFE Test Results (2) Pedestals and Noise
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UFE Test Results (3) Non-Linearity = [Fit-Measured]/Fit upto 1.5[pC] Linear range : 0~1.5pC within 2% nonlinearity
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UFE Test Results (4) External Connection Test
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Conclusion Qualification test setup for VA and UFE board is ready and working successfully. 40 VA Hybrid were tested and two chips were malfunctioning. 12 UFE boards were produced and tested. Pedestal, Noise, Gain, Linearity, Nonlinearity, Peaking Time, Connectivity /Channel/ VA chip/ UFE-Board Some problems are under investigation. Defect on VAs after soldering with UFE, connectivity improvement. Calibration const. DB : data sheet in ASCII format on the WWW. http://accms04.physik.rwth-aachen.de/~chchung/ams/trd/ufe/WWW http://accms04.physik.rwth-aachen.de/~chchung/ams/trd/ufe/
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WWW
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