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EE141 © Digital Integrated Circuits 2nd Devices 1 Digital Integrated Circuits A Design Perspective The Devices Jan M. Rabaey Anantha Chandrakasan Borivoje Nikolic July 30, 2002
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EE141 © Digital Integrated Circuits 2nd Devices 2 Goal of this chapter Present intuitive understanding of device operation Introduction of basic device equations Introduction of models for manual analysis Introduction of models for SPICE simulation Analysis of secondary and deep-sub- micron effects Future trends
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EE141 © Digital Integrated Circuits 2nd Devices 3 The Diode Mostly occurring as parasitic element in Digital ICs
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EE141 © Digital Integrated Circuits 2nd Devices 4 Depletion Region
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EE141 © Digital Integrated Circuits 2nd Devices 5 Diode Current
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EE141 © Digital Integrated Circuits 2nd Devices 6 Forward Bias Typically avoided in Digital ICs
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EE141 © Digital Integrated Circuits 2nd Devices 7 Reverse Bias The Dominant Operation Mode
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EE141 © Digital Integrated Circuits 2nd Devices 8 Models for Manual Analysis
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EE141 © Digital Integrated Circuits 2nd Devices 9 Junction Capacitance
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EE141 © Digital Integrated Circuits 2nd Devices 10 What is a Transistor? A Switch! |V GS | An MOS Transistor
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EE141 © Digital Integrated Circuits 2nd Devices 11 The MOS Transistor Polysilicon Aluminum
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EE141 © Digital Integrated Circuits 2nd Devices 12 MOS Transistors - Types and Symbols D S G D S G G S DD S G NMOS Enhancement NMOS PMOS Depletion Enhancement B NMOS with Bulk Contact
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EE141 © Digital Integrated Circuits 2nd Devices 13 Threshold Voltage: Concept
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EE141 © Digital Integrated Circuits 2nd Devices 14 The Threshold Voltage
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EE141 © Digital Integrated Circuits 2nd Devices 15 The Body Effect
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EE141 © Digital Integrated Circuits 2nd Devices 16 Transistor in Linear
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EE141 © Digital Integrated Circuits 2nd Devices 17 Transistor in Saturation Pinch-off
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EE141 © Digital Integrated Circuits 2nd Devices 18 A model for manual analysis
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EE141 © Digital Integrated Circuits 2nd Devices 19 Current-Voltage Relations A good ol’ transistor Quadratic Relationship 00.511.522.5 0 1 2 3 4 5 6 x 10 -4 V DS (V) I D (A) VGS= 2.5 V VGS= 2.0 V VGS= 1.5 V VGS= 1.0 V ResistiveSaturation V DS = V GS - V T
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EE141 © Digital Integrated Circuits 2nd Devices 20 Process Data
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EE141 © Digital Integrated Circuits 2nd Devices 21 Current-Voltage Relations The Deep-Submicron Era Linear Relationship -4 V DS (V) 00.511.522.5 0 0.5 1 1.5 2 2.5 x 10 I D (A) VGS= 2.5 V VGS= 2.0 V VGS= 1.5 V VGS= 1.0 V Early Saturation
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EE141 © Digital Integrated Circuits 2nd Devices 22 Velocity Saturation (V/µm) c = 1.5 n ( m / s ) sat = 10 5 Constant mobility (slope = µ) Constant velocity
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EE141 © Digital Integrated Circuits 2nd Devices 23 Velocity Saturation (Computation)
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EE141 © Digital Integrated Circuits 2nd Devices 24 Perspective I D Long-channel device Short-channel device V DS V DSAT V GS - V T V GS = V DD
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EE141 © Digital Integrated Circuits 2nd Devices 25 I D versus V DS -4 V DS (V) 00.511.522.5 0 0.5 1 1.5 2 2.5 x 10 I D (A) VGS= 2.5 V VGS= 2.0 V VGS= 1.5 V VGS= 1.0 V 00.511.522.5 0 1 2 3 4 5 6 x 10 -4 V DS (V) I D (A) VGS= 2.5 V VGS= 2.0 V VGS= 1.5 V VGS= 1.0 V ResistiveSaturation V DS = V GS - V T Long ChannelShort Channel
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EE141 © Digital Integrated Circuits 2nd Devices 26 A unified model for manual analysis S D G B
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EE141 © Digital Integrated Circuits 2nd Devices 27 Transistor Model for Manual Analysis
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EE141 © Digital Integrated Circuits 2nd Devices 28 The Sub-Micron MOS Transistor Threshold Variations Subthreshold Conduction Parasitic Resistances
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EE141 © Digital Integrated Circuits 2nd Devices 29 Threshold Variations V T L Long-channel threshold LowV DS threshold Threshold as a function of the length (for lowV DS ) Drain-induced barrier lowering (for lowL) V DS V T
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EE141 © Digital Integrated Circuits 2nd Devices 30 The MOS Transistor Polysilicon Aluminum
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EE141 © Digital Integrated Circuits 2nd Devices 31 MOSFET Capacitance Model
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EE141 © Digital Integrated Circuits 2nd Devices 32 MOSFET Gate Capacitance
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EE141 © Digital Integrated Circuits 2nd Devices 33 MOSFET DB and SB Capacitance
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EE141 © Digital Integrated Circuits 2nd Devices 34 Junction Capacitance
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EE141 © Digital Integrated Circuits 2nd Devices 35 More Process Data
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EE141 © Digital Integrated Circuits 2nd Devices 36 Problems (2)
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EE141 © Digital Integrated Circuits 2nd Devices 37 Problems (3)
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EE141 © Digital Integrated Circuits 2nd Devices 38 Problems (8)
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EE141 © Digital Integrated Circuits 2nd Devices 39 Problems (17)
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EE141 © Digital Integrated Circuits 2nd Devices 40 Latch-up
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