1. Micro and Nano Characterization Facility Girish Kunte June 10 th 2013

2. Agenda Equipment Usage Statistics MNCF – Updates MNCF – New Installations

3. Instrument Usage Statistics – Electrical Lab

4. Instrument Usage Statistics – Mechanical Lab

5. Instrument Usage Statistics – Materials Lab

6. Instrument Usage Statistics – Optical Lab

7. MNCF Updates AFM Issues: – Issues with some modes in Bruker AFM – high noise etc. – Issues worsened with time – Found the AFM scanner has physical damage. Also AFM controller has problems – Correct voltages not being sent to scanner – AFM scanner and controller needs to be sent to Bruker Singapore for repair.

8. MNCF Updates Login System: – Kamal’s login system implemented Issues – Easy to bypass – 2 Interns in MNCF – Developed similar system Earlier issues addressed Currently under test Will be implemented across MNCF next week by 10 th August

9. MNCF Updates Weekly Calibration / Test Reports – Weekly test reports on each instrument to be generated in MNCF – Check all modes / capabilities of machines – Will help identify potential problems, etc

10. MNCF – New Installations UV Visible Spectrometer is installed and available for booking.

11. Thank You!