1. 作者及出處 : Dietmar Kissinger (kissinger@lfte.de), Benjamin Laemmle (laemmle@lfte.de), and Robert Weigel (weigel@lfte.de) are with the Institute for Electronics Engineering, University of Erlangen-Nuremberg, Cauerstrasse 9, 91058 Erlangen, Germany. Linus Maurer (linus.maurer@infi neon.com) is with Danube Integrated Circuit Engineering (DICE), Freistädter Str. 400, 4040 Linz, Austria. 報告題目 : Integrated Test for Silicon Front Ends 授課老師 : 陳文山 報告學生 : 梁書華 學 號 : M9930102 班 級 : 碩電一甲 1

2.  In a transceiver front-end analog, RF electronics are present in the front-end, whereas digital circuitry is used for baseband processing.  The front-end can be subdivided into the transmit and receive path with their respective performance parameters like maximum output power, linearity, sensitivity, and dynamic range.  Analog and RF front-end building blocks must be tested for their functionality and specification like frequency response, linearity, noise power ratio, and absolute power levels.  For the baseband circuitry, standard digital test techniques already exist. 2

3. 3 資料來源 : Dietmar Kissinger (kissinger@lfte.de), Benjamin Laemmle (laemmle@lfte.de), and Robert Weigel (weigel@lfte.de) are with the Institute for Electronics Engineering, University of Erlangen-Nuremberg, Cauerstrasse 9, 91058 Erlangen, Germany. Linus Maurer (linus.maurer@infi neon.com) is with Danube Integrated Circuit Engineering (DICE), Freistädter Str. 400, 4040 Linz, Austria.

4. 4 資料來源 : Dietmar Kissinger (kissinger@lfte.de), Benjamin Laemmle (laemmle@lfte.de), and Robert Weigel (weigel@lfte.de) are with the Institute for Electronics Engineering, University of Erlangen-Nuremberg, Cauerstrasse 9, 91058 Erlangen, Germany. Linus Maurer (linus.maurer@infi neon.com) is with Danube Integrated Circuit Engineering (DICE), Freistädter Str. 400, 4040 Linz, Austria.

5. 5 資料來源 : Dietmar Kissinger (kissinger@lfte.de), Benjamin Laemmle (laemmle@lfte.de), and Robert Weigel (weigel@lfte.de) are with the Institute for Electronics Engineering, University of Erlangen-Nuremberg, Cauerstrasse 9, 91058 Erlangen, Germany. Linus Maurer (linus.maurer@infi neon.com) is with Danube Integrated Circuit Engineering (DICE), Freistädter Str. 400, 4040 Linz, Austria.

6. 6 資料來源 : Dietmar Kissinger (kissinger@lfte.de), Benjamin Laemmle (laemmle@lfte.de), and Robert Weigel (weigel@lfte.de) are with the Institute for Electronics Engineering, University of Erlangen-Nuremberg, Cauerstrasse 9, 91058 Erlangen, Germany. Linus Maurer (linus.maurer@infi neon.com) is with Danube Integrated Circuit Engineering (DICE), Freistädter Str. 400, 4040 Linz, Austria.

7. 7 資料來源 : Dietmar Kissinger (kissinger@lfte.de), Benjamin Laemmle (laemmle@lfte.de), and Robert Weigel (weigel@lfte.de) are with the Institute for Electronics Engineering, University of Erlangen-Nuremberg, Cauerstrasse 9, 91058 Erlangen, Germany. Linus Maurer (linus.maurer@infi neon.com) is with Danube Integrated Circuit Engineering (DICE), Freistädter Str. 400, 4040 Linz, Austria.

8. 8 資料來源 : Dietmar Kissinger (kissinger@lfte.de), Benjamin Laemmle (laemmle@lfte.de), and Robert Weigel (weigel@lfte.de) are with the Institute for Electronics Engineering, University of Erlangen-Nuremberg, Cauerstrasse 9, 91058 Erlangen, Germany. Linus Maurer (linus.maurer@infi neon.com) is with Danube Integrated Circuit Engineering (DICE), Freistädter Str. 400, 4040 Linz, Austria.

9. 9 資料來源 : Dietmar Kissinger (kissinger@lfte.de), Benjamin Laemmle (laemmle@lfte.de), and Robert Weigel (weigel@lfte.de) are with the Institute for Electronics Engineering, University of Erlangen-Nuremberg, Cauerstrasse 9, 91058 Erlangen, Germany. Linus Maurer (linus.maurer@infi neon.com) is with Danube Integrated Circuit Engineering (DICE), Freistädter Str. 400, 4040 Linz, Austria.

10. 10 資料來源 : Dietmar Kissinger (kissinger@lfte.de), Benjamin Laemmle (laemmle@lfte.de), and Robert Weigel (weigel@lfte.de) are with the Institute for Electronics Engineering, University of Erlangen-Nuremberg, Cauerstrasse 9, 91058 Erlangen, Germany. Linus Maurer (linus.maurer@infi neon.com) is with Danube Integrated Circuit Engineering (DICE), Freistädter Str. 400, 4040 Linz, Austria.

11. 11 資料來源 : Dietmar Kissinger (kissinger@lfte.de), Benjamin Laemmle (laemmle@lfte.de), and Robert Weigel (weigel@lfte.de) are with the Institute for Electronics Engineering, University of Erlangen-Nuremberg, Cauerstrasse 9, 91058 Erlangen, Germany. Linus Maurer (linus.maurer@infi neon.com) is with Danube Integrated Circuit Engineering (DICE), Freistädter Str. 400, 4040 Linz, Austria.

12. 12 資料來源 : Dietmar Kissinger (kissinger@lfte.de), Benjamin Laemmle (laemmle@lfte.de), and Robert Weigel (weigel@lfte.de) are with the Institute for Electronics Engineering, University of Erlangen-Nuremberg, Cauerstrasse 9, 91058 Erlangen, Germany. Linus Maurer (linus.maurer@infi neon.com) is with Danube Integrated Circuit Engineering (DICE), Freistädter Str. 400, 4040 Linz, Austria.

13. 13 資料來源 : Dietmar Kissinger (kissinger@lfte.de), Benjamin Laemmle (laemmle@lfte.de), and Robert Weigel (weigel@lfte.de) are with the Institute for Electronics Engineering, University of Erlangen-Nuremberg, Cauerstrasse 9, 91058 Erlangen, Germany. Linus Maurer (linus.maurer@infi neon.com) is with Danube Integrated Circuit Engineering (DICE), Freistädter Str. 400, 4040 Linz, Austria.

14. 14 資料來源 : Dietmar Kissinger (kissinger@lfte.de), Benjamin Laemmle (laemmle@lfte.de), and Robert Weigel (weigel@lfte.de) are with the Institute for Electronics Engineering, University of Erlangen-Nuremberg, Cauerstrasse 9, 91058 Erlangen, Germany. Linus Maurer (linus.maurer@infi neon.com) is with Danube Integrated Circuit Engineering (DICE), Freistädter Str. 400, 4040 Linz, Austria.

15. 15 資料來源 : Dietmar Kissinger (kissinger@lfte.de), Benjamin Laemmle (laemmle@lfte.de), and Robert Weigel (weigel@lfte.de) are with the Institute for Electronics Engineering, University of Erlangen-Nuremberg, Cauerstrasse 9, 91058 Erlangen, Germany. Linus Maurer (linus.maurer@infi neon.com) is with Danube Integrated Circuit Engineering (DICE), Freistädter Str. 400, 4040 Linz, Austria.

16.  這篇強調了，微波技術的新穎，使用了 SiGe 雙極性的技術，讓 DDS 工作頻率極易 達到所需參數，讓此次試驗 BIST 產生精確 的電路測試，常理來講，成本是製程絕對 的關鍵，因此找出減少成本是基本原理。 16