1. Design and fabrication of electrical measurement system for microchannel plates (LAPD weekly group meeting) Feb-01-2011 Anil Mane, Qing Peng, Jeffrey Elam ALD Research Program, Process Technology Research Group Energy Systems Division.

2. Objective: To build UV-based gain measurement set up for quick ALD functionalized MCP performance test

3. Photograph of gain measurement setup:  Ready to test MCP  Test 1-2 MCP per day (cause by small capacity turbo pump) 10/28/2010 Dual MCPs testing (Possible to load 3 MCPs) 3 high voltage (0-5kV) DC power supply pA current meter A new EMWCD submitted in Oct 10 and approved in first week of Jan 11

4. HW design for MCP Gain test Electrical connections Shielded UV source for electron generation Drain resistors box

5. Photograph of MCP(s) holder assembly:  MCP 114 is loaded on the holder and will be tested 10/28/2010 Al anode Anode and MCP bottom contact separated with insulating spacers MCP top contact

6. I-V data with now set-up:  Connections are ok 10/28/2010 R=60M 

7. System capabilities: Current vs. Voltage (I-V) Resistance vs. Temperature (R-T)  (Thermal coefficient, activation energy) Resistance vs. Time (R-t) @ fix HV Gain vs. voltage Long term stability under scrubbing condition Two optical windows (possible to get thermal imaging with CCD)