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Digital Integrated Circuit Design
EE141 Digital Integrated Circuit Design Andrea Bonfanti DEIB Via Golgi 40, Milano Manufacturing Process
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CMOS Process n-well CMOS Process
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Twin-well CMOS Process
Twin-well Trench-Isolated CMOS Process
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Triple-well CMOS Process
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Circuit Under Design
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Its Layout View nwell metal1 n+ diffusion poly p+ diffusion
contact p+ diffusion
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Its Layout View (2)
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Its Layout View (2)
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Its Layout View (2)
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Photo-Lithographic Process
optical mask oxidation photoresist photoresist coating removal (ashing) stepper exposure Typical operations in a single photolithographic cycle (from [Fullman]). photoresist development acid etch process spin, rinse, dry step
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Patterning of SiO2 Chemical or plasma etch Si-substrate
Hardened resist SiO 2 (a) Silicon base material Si-substrate Photoresist SiO 2 (d) After development and etching of resist, chemical or plasma etch of SiO Si-substrate 2 (b) After oxidation and deposition Hardened resist of negative photoresist SiO 2 Si-substrate UV-light Patterned (e) After etching optical mask Exposed resist SiO 2 Si-substrate Si-substrate (f) Final result after removal of resist (c) Stepper exposure
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CMOS Process at a Glance
Define active areas Etch and fill trenches Implant well regions Deposit and pattern polysilicon layer Implant source and drain regions and substrate contacts Create contact and via windows Deposit and pattern metal layers
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CMOS Process Walk-Through
+ p-epi (a) Base material: p+ substrate with p-epi layer p + p-epi SiO 2 3 Si N 4 (b) After deposition of gate-oxide and sacrificial nitride (acts as a buffer layer) p + (c) After plasma etch of insulating trenches using the inverse of the active area mask
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CMOS Process Walk-Through
SiO 2 (d) After trench filling, CMP planarization, and removal of sacrificial nitride (e) After n-well and V Tp adjust implants n (f) After p-well and V Tn adjust implants p
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CMOS Process Walk-Through
(g) After polysilicon deposition and etch poly(silicon) (h) After n + source/drain and p source/drain implants. These steps also dope the polysilicon. (i) After deposition of SiO 2 insulator and contact hole etch. SiO
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CMOS Process Walk-Through
(j) After deposition and patterning of first Al layer. Al (k) After deposition of SiO 2 insulator, etching of via’s, deposition and patterning of second layer of Al. Al SiO
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Metallization
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Advanced Metallization
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Design Rules
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3D Perspective Polysilicon Aluminum
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Design Rules Interface between designer and process engineer
Guidelines for constructing process masks Unit dimension: minimum line width scalable design rules: lambda parameter absolute dimensions (micron rules)
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Single-well CMOS Process Layers
Polysilicon Metal1 Metal2 Contact To Poly Contact To Diffusion (ntap, ptap) Via Well (n) Active (diffuision n+ or p+) Color Representation Yellow Green Red Blue Magenta Black Select (n+)
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Layers in 0.25 mm CMOS process
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Intra-Layer Design Rules
4 Metal2 3
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Transistor Layout (PMOS)
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Vias and Contacts
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Select Layer
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CMOS Inverter Layout
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Layout Editor
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Design Rule Checker
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Design Rule Checker
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The final result
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Packaging
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Packaging Requirements
Electrical: low parasitics Mechanical: reliable and robust Thermal: efficient heat removal Economical: cheap
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Bonding Techniques
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Tape-Automated Bonding (TAB)
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Flip-Chip Bonding
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Package-to-Board Interconnect
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Package Types
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Package Parameters
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Multi-Chip Modules
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