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The Effects of Operating Conditions on Speed and Power of Replica – Based SRAM Circuits Nika Sharifvaghefi Nicholas Kumar EE241 - Spring 2012
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Sense-Amp in SRAMS Instead of waiting for the actual bitline to discharge we take an early measurement Saves power Saves time
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Sense-Amp Timing When do we take the measurement? Too early error Too late waste of power and time Conventional solution: Inverter chain
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Problems Static fixed delay – Hard to find the proper amount without putting restrictions on usage condition – Have to pay a penalty (power) in normal conditions PVT variations affect SRAM cells and inverters in different ways – Again have to put more slack
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Solution: Replica Use SRAM cells instead of inverters Affected the same way by PVT variations Replica is not a full column
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Problems with Replica Still have variations due to process Have to add unnecessary slack When Vdd goes down, we have fewer replica cells, so variation becomes important
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Different Solutions Divide the bitline into independent parts – Works when #stages is low – Delay of extra logic between stages becomes important if #cells is low or #stages is high Pick replica cells from a large set of configurable cells. Pick the best ones – Works very well – Requires post-silicon testing
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Different Solutions Use a Timing Multiply Circuit – Use more replica cells than we should – We can’t use the raw replica output or else we’d get errors from sense-amp – Make up for the reduced delay by multiplying it using a TMC
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TMC The clock signal goes through a forward path As soon as the input signal goes up, the forward path gets transported to a backward path If the backward path uses N times as many delay cells as the forward path does, the input delay gets multiplied by N+1
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Implementation Implemented in Cadence using 90nm tech Result:
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Conclusion Using a TMC – Lowers the variation and therefore the unnecessary slack – Doesn’t need post-silicon test – Viable for low Vdd Disadvantages – Adds to the area – Variation in delay cells
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