1. Fermilab PMG - Results from module testing - April 9, 2004 – E.Chabalina (UIC) 1 Results from module testing E.Chabalina University of Illinois (Chicago) On behalf of the US testing group Outline Status of test equipment and manpower Testing capacity Recent test results  common mode noise  other failures Conclusions and outlook

2. Fermilab PMG - Results from module testing - April 9, 2004 – E.Chabalina (UIC) 2 Module Testing Cycle Wire bond (15)Module quick test (15) Storage/Mount on Rods Thermal cycle modules (15): 2 loads, 8 hours each Pinhole tests (15) Gantry makes modules (15) Rod testing will be covered in P.Tipton’s talk Expected peak production rate – 15 modules per day

3. Fermilab PMG - Results from module testing - April 9, 2004 – E.Chabalina (UIC) 3 Test equipment and capacity Fermilab Clean Room lab D  Adjacent to production area  Hybrid characterization and thermal cycling  Single module quick test 2 ARC test stations Clean Room lab C  Single module quick test 2 ARC test stations  Module burn-in station UCSB Clean Room  Adjacent to production area  Hybrid characterization and thermal cycling  Single module quick test 3 ARC test stations  Module burn-in station Total testing capacity per site: Hybrid  28/day (4hybrids per load  7 hours) Module Test ~24/day (1h/module  8h  3stands) LT Test ~20/day (10 modules per load  ½ day thermal cycles)

4. Fermilab PMG - Results from module testing - April 9, 2004 – E.Chabalina (UIC) 4 ManpowerManpower Fermilab professors – 2 postdocs - 2 graduate students – 1 exchange visitor - 1 engineer - 1 technicians – 3 Trained to run ARC:  2 technicians  1 engineer Trained to run LT:  1 grad student  1 exchange visitor  2 technicians UCSB professors – 2 postdocs - 3 graduate students - 2 electrical engineers - 1 mechanical engineers – 2 undergraduate students – 3 Trained to run ARC:  ? Trained to run LT:  ?  2

5. Fermilab PMG - Results from module testing - April 9, 2004 – E.Chabalina (UIC) 5 ARCS Based Test Stands Hybrid testing  Thermal cycle/pulsing Module testing  LED systems Pinhole/Open Tests  DEPP HV supply Automated IV curves  3 Module test stands at UCSB 2 TOB 1 TEC  4 Module test stands at Fermilab DEPP LED Controller ARC Controllers ARCS - APV Readout Controller Software Purpose - Fast testing of hybrids and modules LED System ARC FE And adaptor card

6. Fermilab PMG - Results from module testing - April 9, 2004 – E.Chabalina (UIC) 6 Module Testing with ARCS Module testing has matured greatly  A standard set of tests was defined  Fault finding algorithms are now tuned to maximize fault finding and fault type identification, while minimizing false bad channel flagging Testing procedures are now almost automated  Wo to automate testing  fault finding  module grading  database entry underway Noise performance and shielding standardization has allowed for the same fault finding algorithms to work on the TIB, TEC & TOB modules  Minimize the effects of external noise sources  All test stands are cross calibrated to identify the same faults Faults identified:  sensor-sensor opens;  sensor-PA opens;  mid-sensor opens;  pinholes;  noisy channels.

7. Fermilab PMG - Results from module testing - April 9, 2004 – E.Chabalina (UIC) 7 Fault Finding Using ARCS Noisy 1 sensor open 2 sensor open Pinholes Bad Channel Flags Noise Measurement Pulse Height Measurement (with Calibration Pulse) Bad Channel Flags Shorts Pinhole Opens

8. Fermilab PMG - Results from module testing - April 9, 2004 – E.Chabalina (UIC) 8 DAQ Based Test Stands DAQ system – a PC based prototype of the real CMS tracker readout chain Purpose – fast and burn-in testing of modules and rods Module Burn-in (Wien box) Same structure of root output as on ARCS Similar analysis macro is applied to LT data for fault finding

9. Fermilab PMG - Results from module testing - April 9, 2004 – E.Chabalina (UIC) 9 Recent Module Production Goals  To establish new peak production capacity (15 modules/day) Determine if testing capabilities sufficient  Build as many modules as possible using new ST sensors as agreed upon in December Use sensor grading scheme to find out if subclass of perfect sensors exists (A, A+, A++) Complete set of module tests made  ARCS quick test  Module thermal cycle (Vienna Box) 1 thermal cycle for each module (~7  10 hours)  LED test Results: USCB – 150, Fermilab – 102  Easily met testing capacity needs  Extremely low rate of introduced failures seen  CMN modules occurred at same rates as previous builds using re- probed sensors Did not appear to depend on production period or sensor grading

10. Fermilab PMG - Results from module testing - April 9, 2004 – E.Chabalina (UIC) 10 UCSB Module Quality/Grading 117 modules tested so far Failure rates/sources (excluding CMN modules)  0.39% Bad channels on average 0.26% Known bad sensor channels 0.13% Unmarked bad sensor channels 0.004% open hybrid-APV bonds 0.001% module bonding 0.002% testing errors  Less than 0.01% bad channels introduced during assembly/bonding/testing Module Grading  5 Grade B All due to sensor faults  7 Grade A/F 6 CMN modules 1 after thermal cycle 1 module fails to operate at -20 C Tested in 3 different Vienna box slots  2 Grade C/F 12 mid-sensor opens in aluminum strips (lithographic error) 1 CMN module

11. Fermilab PMG - Results from module testing - April 9, 2004 – E.Chabalina (UIC) 11 FNAL Module Quality/Grading

12. Fermilab PMG - Results from module testing - April 9, 2004 – E.Chabalina (UIC) 12 Thermal Cycling Results Thermal Cycling Results UCSB: 101 modules thermal cycled  One module does not function at -20 C Tested in 3 different cold box slots Hybrid bonded and thermal- cycled at UCSB without seeing this effect  One module developed CMN Prior to thermal cycling, the channel had 10 ADC noise Now consistently has CMN  One module have a single APV channel burn-out  Multiple noisy channels (2-5 ADC) appeared and disappeared after cycling Fermilab:

13. Fermilab PMG - Results from module testing - April 9, 2004 – E.Chabalina (UIC) 13 CMN modules and sensor grading Sensors graded using Vienna rules  All sensors were re-probed prior to assembly  Worst sensor grading out of two measurements used Sensors sub-divided into three time periods  Prior to Week 39, 2002 (Pre-production)  Week 39, 2002-Week 12, 2003 (Production improvements being implemented)  Week 13, 2003-now (Final Production) 7 Common mode modules found (6% of production)  Same rate as seen previously with re-probed sensors  1 after thermal cycling No statistically significant difference rate in CMN modules for the different sensor grading Sensor 2001-22002-32003 Grade NUMBERCMN%NUMBERCMN%NUMBERCMN% GRADE A+291 3.4%4 125.0%1200.0% GRADE A3825.3%1119.1%1616.3% GRADE B000.0%6116.6%100.0%

14. Fermilab PMG - Results from module testing - April 9, 2004 – E.Chabalina (UIC) 14 New CMN Module IV Curves After Thermal Cycle

15. Fermilab PMG - Results from module testing - April 9, 2004 – E.Chabalina (UIC) 15 CMN Module Bias Current A large fraction (7/23) of CMN noise modules show a less than 5  A current increase relative to the sensor QTC expectations! 4 of the modules built with re-probed bad sensors with >10 mA increase in bias current

16. Fermilab PMG - Results from module testing - April 9, 2004 – E.Chabalina (UIC) 16 Module Time Degradation- Module 689 After 3 months on shelf, module retested Second chip now has a high noise channel which causes common mode noise  Channel previously only had a slightly higher noise (0.3 ADC)

17. Fermilab PMG - Results from module testing - April 9, 2004 – E.Chabalina (UIC) 17 After assembly module was tested (09/08) on ARCS at 400 V and graded “B” (6 faulty channels). No problems observe. After sitting on shelf for more than 3 months, module re-tested. A new pinhole is found Module Time Degradation-705 After LT, one chip shows CMN

18. Fermilab PMG - Results from module testing - April 9, 2004 – E.Chabalina (UIC) 18 ConclusionsConclusions Testing infrastructure is ready for the large scale module production Testing facilities have trained personal and with sufficient experience 252 TOB modules were produced and fully tested in US in 2004 Ability to test at peak production rate of 15/day demonstrated for ~2 week period  Modules have excellent quality BUT CMN modules are still being produced at the ~5% rate!!!!