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2006 Work Plan Y. Sugimoto 25-Apr-2006
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Study Items Basic study of fully depleted CCD Simulation studies for FPCCD VTX Radiation damage Thin wafer and the support structure Conceptual design of FPCCD for ILC Readout ASIC
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Basic study of fully-dep. CCD Charge spread Back-illumination CCD (S7170-0909-deep2) LASER / Fe55 April – May Lorentzs angle From May 8 th – 2 weeks at KEK cryogenic center S7170-0909-deep2 with S5466 as a reference
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Simulation studies for FPCCD VTX Background rejection with cluster shape Tracking efficiency with beam background Flavor tagging Vertex charge
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Radiation damage study Clock dependence of CTI Using standard CCD irradiated before Electron annealing Verify Nick’s report Using CCDs irradiated with neutron before Irradiate with -source or beam? Radiation damage of fully-depleted CCD Irradiate with -source or beam? Radiation damage of FPCCD When can we get the FPCCD? – Up to HPK
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Thin wafer and the support structure Consider 2 options Partially thinned wafer Si-RVC-Si sandwich Simulation with FEA program Measurement of flatness for partially thinned wafer (S7170-0909-deep2) Can we get RVC sample?
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Conceptual design of FPCCD Simulation using FEMLAB Discussion with HPK Simulation using ENEXSS-TCAD
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Readout ASIC Goal (3 years): 16/32 ch Amp-CDS-ADC with 0.635 mm pitch System noise < 50 electrons (depends on CCD) 4 – 6 bit 20 Mpix/sec Power: < 10 mW/ch (depends on thermal design of VTX) Target of this year: 1ch sample device Organization Osaka Univ. group is also doing R&D of CP-CCD and the R.O. ASIC for X-ray astronomy Ikeda-san (JAXA) is collaborating with Osaka group for the ASIC Collaboration with Ikeda-san would be efficient for our R&D
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R&D Schedule Charge spread /Lorentz angle WS FebMarAprMayJunJulAugSepOctNovDecJanFeb Study of radiation damage Clock v.s. CTI, Damage of full-dep. CCD,etc, B.G. rejection by cls shape Flavor tagging efficiency, etc. Tracking efficiency Machine-time? R&D of r.o. ASIC Thin wafer / Support FPCCD Conceptual design Deadline for proposal to LNS
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Funding sources TOKUTEI-KOUBO – “T” KIBAN-(C) – “C” GAKUJYUTU-SOSEI – “G” KEK Annual budget – “A” Basic study of fully depleted CCDC Simulation study for FPCCD VTX for ILCC Radiation damageStandard sizeC, A Fine PixelT, G ElectronicsA, T Thin wafer / support structureC FPCCD conceptual designC, G Readout ASICG
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Expected manpower Basic study of fully depleted CCDY.S., K.N., all Simulation study for FPCCD VTX for ILCT.N., PD-A, A.M., PD-B Radiation damageStandard sizeY.S., K.N., PD-B, T.N., PD-A, St-A, and all Fine Pixel ElectronicsK.N. Thin wafer / support structureY.S. FPCCD conceptual designY.S., PD-B Readout ASICPD-A, St-A, K.I. PD-A: Post-doc at Tohoku (Oct.06~) PD-B: Post-doc at KEK (Oct.06~) St-A: Student at Tohoku
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Summary We have won satisfactory level of funding for sensor R&D (not enough for all of R&D items of VTX) We have a lot of things to do We now need manpower At least 2 post-docs (Tohoku and KEK) by “GAKUJUTSU- SOSEI” grant We anticipate more post-docs supported by “Postdoctoral fellowships for foreign researchers” of JSPS ( http://www.jsps.go.jp/english/e-fellow/fellow.html )http://www.jsps.go.jp/english/e-fellow/fellow.html We also hope many graduate students to join
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