1. Transmission Electron Microscopy (TEM)
Basic Principles & Application in Thin Film
Photovoltaic Materials
Puvaneswaran Chelvanathan
P65212
Principal Supervisor: Professor Dr. Nowshad Amin

2. Presentation Outline
Introduction : Limitation of Visible Light Microscopy (VLM)
Electron Wave-Like Nature
TEM Components & Working Principle
TEM Image Generation
Interpretation of TEM Images
Application in PV Research Field
TEM Facility : Hi-Tech Ltd.
Conclusion

3. Limitation of Light Microscopy

4. Resolution Illustration
Diffraction Barrier Phenomena

5. Visible Light & λ Abbe’s Diffraction Limit :
“ It is a poor comfort to hope that human ingenuity
will find ways and means of overcoming this limit”
20 years later…….

6. Particle-Wave Duality
P.E
K.E
Taking Relativistic Effect into account:

7. Accelerating Voltage Vs. λ

8. Light Vs. Electrons

9. Wave-Matter Interaction

10. Introduction to Electron Microcopy

11. Optical vs. TEM vs. SEM vs. CRT

12. TEM Working Principle

13. Electron Gun

14. Electron Gun Types

15. Electron Gun Types

16. Electron Lens

17. Electron Lens

18. Optical Lens vs. Electron Lens

19. Principle of Electron Lens

20. Electron Beam Alignment

21. Electron Beam Focusing

22. Imaging: “Seeing The Electrons”

23. Imaging vs. Diffraction Pattern (DP)

24. Imaging : Bright Field vs. Dark Field

25. Imaging : Bright Field vs. Dark Field

26. Imaging : Bright Field

27. Imaging : Bright Field

28. Diffraction Pattern

29. Diffraction Pattern

30. Diffraction Pattern

31. Diffraction Pattern

32. Diffraction Pattern

33. Diffraction Pattern

34. Application in PV Device/Materials

35. Application in PV Device/Materials

36. Application in PV Device/Materials

37. Application in PV Device/Materials

38. Application in PV Device/Materials

39. Application in PV Device/Materials

40. Application in PV Device/Materials

41. TEM Facility : Hitech, Puchong

42. Some Results…. MoS2

43. Some Results…. MoS2

44. XRD vs. SAED
XRD
SAED

45. Conclusion TEM Fundamental Limitation of VLM
TEM Main components & operating principles
Image generation: BF, DF and DP
Interpretation of DP
Application in PV research
Jeol Electron Microscopy
1.25 MeV HVEM

46. * Remarks Topics Not covered: TEM Sample Preparation
Convergent Beam Electron Microscopy (CBED)
Analytical Electron Microscopy (AEM)
- Electron Energy Loss Spectroscopy (EELS)
- Cathodoluminescence (CL)