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High frequency hopping conductivity in semiconductors. Acoustical methods of research. I.L.Drichko Ioffe Physicotechnical Institute RAS Физико-технический институт им. А.Ф.Иоффе РАН, 194021, С.- Петербург, ул.Политехническая, 26
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Outline 1.Two-site model of high frequency hopping conductivity 2. 3-dimensional high frequency hopping 3. 2-dimensional high frequency hopping 4. high frequency hopping in system with dense arrays of Ge –in- Si quantum dots
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High- frequency hopping conductivity Two-site model E, = 1 - 2 is the difference between initial energies of impurity sites 1 and 2 (r)= 0 e -r/ is the overlap integral, where 0 E B, is the localization length r 1.Resonant (phononless) absorption 2.Relaxation (nonresonant) absorption Two-site model can be applied if ( )>> (0). The hops between different pairs are absent.. 1 2
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Relaxation case M.Pollak V.Gurevich Yu.Galperin D.Parshin A.Efros B.Shklovskii n 0 is the equilibrium value of n The very important point is that it is necessary to take into account the Coulomb correlation (A.Efros, B.Shklovskii) Two regimes 0 (E) is the minimum value of the population relaxation time for symmetrical pairs with =0 0 <<1 ~ hf ~ T 0 0 >>1, ~ hf ~1/ 0 (kT)~ 0 T n ~cos t
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Effect of magnetic field An external magnetic field deforms the wave function of the impurity electrons and reduces the overlap integrals . This integral depends on the angle between the magnetic field Н and an arm of pair r. Weak magnetic field Н<H 0 ~H 2 ~H 2 High magnetic field Н>H 0 ~H -4/3 ~H -2 - (H)= (0)- (H) (H)=- (0)+b/H 2
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Acoustic methods Sample CABLE piezotransducer Setup for 3-dimensional systems Setup for low dimensional systems 17-400 MHz 150-1500 MHz T=0.3-4.2 K, H=0-8 T
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Dependences of (0) от Т; f=810(1), 630(2), 395(3),336(4), 268(5),207MHz(6) Dependences of оn Н; 1-0.58К, 2-2.15К, 3-4.2К f=810 MHz Lightly doped strongly compensated (К=0.84) n-InSb, 3-dimensional case
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A = 8b(q)( 1 + 0 ) 0 2 s exp[2q(a+d)], 2- Dimensional case 3-dimensional case 1 = Re hf ~ 2 = Im hf ~ V/V
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HF-hopping in 2D case A.L.Efros, Sov.Phys.JETP 62 (5),p.1057 (1985)
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A = 8b(q)( 1 + 0 ) 0 2 s exp[2q(a+d)], 2- Dimensional case 3-dimensional case 1 = Re hf ~ 2 = Im hf ~ V/V
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The absorption coefficient Γ and the velocity shift V/V vs. magnetic field (f=30 MHz) The dependences of real 1 and imaginary 2 parts of high frequency conductivity, T=1.5 K, f=30 MHz; n-GaAs/AlGaAs
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Dependences of 1, 2 on H near =2 at different T, n-GaAs/AlGaAs
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Two-site model nonlinearity
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The systems with a dense (4 10 11 cm –2 ) array of Ge quantum dots in silicon, doped with B. Quantum dots (QD) has a pyramidal shape with the square base 100×100 ÷ 150×150 Ǻ 2 and the height of 10-15 Ǻ. The samples have been delta-doped with B with the concentration (1÷1.12)·10 12 cm -2. The boron concentration corresponds to the average QD filling 2.85 2.5 per dot
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Linear regime
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In linear regime the high frequency hopping conductivity looks like hopping predicted by of "two-site model" provided >1 if holes hop between quantum dots. But 1 > 2. Left-Temperature dependence of in the sample 1 for f=30.1 and 307 MHz, a=5 10 -5 cm. Right-Frequency dependence of in the sample 2 at T-4.2 K, a=4 10 -5 cm
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Nonlinear regime
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Results of numerical simulations for b (the distance between the dots) Galperin, Bergli
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Conclusion Hopping relaxation conductivity At R> , where R is the distance between pairs of impurity site, is the localization length 1. Hopping conductivity in 3-dimensional strongly compensated lightly and heavily doped semiconductors (n-InSb) is successfully explained by two-site model In strongly compensated lightly doped n-InSb it was observed crossover from 1. 2.In two-dimensional structures with quantum Hall effect there is hopping conductivity. This one is observed in minima of conductivity at small filling-factors and it is successfully explained by two-site model too. In this case Im >Re At R 3. The main mechanism of HF conduction in hopping systems with large localization length (dense arrays of Ge –in- Si quantum dots) is due to charge transfer within large clusters.
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Acknowledgments I am very grateful to my numerous co-authors: Yu.M.Galperin, L.B.Gorskaya, A.M.Diakonov, I.Yu.Smirnov, A. V.Suslov, V.D.Kagan, D.Leadley, V. A.Malysh, N.P.Stepina, E.S.Koptev, J.Bergli, B.A.Aronzon, D. V.Shamshur and ours very good technologists: V.S.Ivleva, A.I.Toropov, A.I. Nikiforov
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