1. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 1 Testbenches Custom Designed Integrated Circuits

2. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 2 Testbenches, Text IO Text IO routines are part of VHDL. TextIO is suitable to use in testbenches to read stimuli from a file and write results on a file. Write procedures: write(….) -- write to buffer writeline(…) -- write to file Read procedures: read(…) -- read from buffer readline(…) -- file to buffer process variable text_line: line; variable out_data: integer:=0; file my_file: text open write_mode is ”textfile.txt”; begin for i in 0 to 10 loop write(text_line,”counter=”); out_data:=out_data+1; write(text_line, out_data); writeline(my_file, text_line); end loop; wait; -- stop process end process; declare buffer my_file= file handle write to file write buffer file name and type and mode

3. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 3 Testbenches, Text IO Text IO routines are part of VHDL. TextIO is suitable to use in testbenches to read stimuli from a file and write results on a file. Write procedures: write(….) -- write to buffer writeline(…) -- write to file Read procedures: read(…) -- read from buffer readline(…) -- file to buffer process variable text_line: line; variable in_data: character; file my_file: TEXT open read_mode is ”crc.txt”; begin while not endfile(my_file) loop readline(my_file, text_line); read(text_line, in_data); if in_data=’1’ then -- ascii insig<=’1’; elsif in_data=’0’ then insig<=’0’; else assert false ….. end if; end loop; end process; read mode file to buffer from buffer to variable loop until end of file

4. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 4 process subtype byte is std_logic_vector(7 downto 0); type storage_array is array (0 to 255) of byte; variable storage: storage_array; variable index: natural; -- natural ={0 to highest int} type load_type is file of byte; file load_file: load_type open read_mode is ”bytefile”; begin index:=0; while not endfile(load_file) loop read(load_file, storage(index)); index:=index+1; end loop; wait; end process; Test benches, File IO, General File IO can be used to write and read data elements. One element is written or read for each write or read command. The file pointer is incremented for each write/read command. The type of file and the mode must be declared in the file- declaration.

5. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 5 Composite Data Types Subtypes subtype short is integer range 0 to 255; subtype byte is std_logic_vector(7 downto 0); Arrays type ROM_type is array (0 to 31) of byte; variable ROM: ROM_type; Records type time_stamp is record seconds: integer range 0 to 59; minutes: integer range 0 to 59; hours: integer range 0 to 23; end record time_stamp; variable sample_time, current_time: time_stamp; Examples: sample_time:=current_time; sample_hour:=sample_time.hours;

6. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 6 Verifying the design How can a component (VHDL) be verified? Use script language ( Simulator Control Language) –Platform dependent (-) –Risk for same errors in the test bench as in the design ( if the designer makes the test bench) (-) Use VHDL test bench –Platform independent (+) –Same risk for errors as SCL (-) –Can be done by system design engineer (executable spec) (+) System level simulations –Good in finding interface errors (+) –Models used are (shall have been) verified (+)

7. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 7 Verifying the design Conclusion Use VHDL Test bench both on behavioral and RT levels as a first step –Powerful language (compared to SCL) –Portable –Common language Simulate on System level as a second step –If VHDL test bench can be used or not depends on availability of simulation models (for ASICs)

8. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 8 System level simulations VHDL- RTL PP EPROM 74HCxRAM System level simulation represents the environment (Example)

9. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 9 Verifying the design Test benchComputer VHDL ”prototype ” VHDL comp ”signal gener.” A VHDL comp ”logic analyzer” B Verification with a test bench (A and B) in the computer

10. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 10 Example: UART Testbench UART (UUT) Processor (BFM) FM Data(7 downto 0) Controls Interrupts Reset/clock Transmit Data Receive Data UUT=Unit Under Test FM=Functional Model BFM=Bus Functional Model

11. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 11 Verifying the design. Design flow Design specification VHDL behavioral model Graphical VHDL tool Simulation VHDL (RTL) Simulation A Behavioral level Graphical VHDL tool Specification level RT level

12. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 12 Verifying the design. Design flow Synthesis Test vector generation Simulation Place & route (layout) Simulation A Netlist level (before layout) Implement in hardware Netlist level (after layout)

13. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 13 Testbenches in VHDL. Verification There are three verification steps during development: The behavioral model verification The RTL VHDL model verification Gate level verification both before and after layout Testbenches can be used in all three steps. VHDL model VHDL RTL model Gate level e.g. VITAL VHDL test- bench VITAL is a library with VHDL primitives to describe a circuit after layout. Both gate and wire delays are included Static timing analysis can replace simulation in this step

14. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 14 Testbenches in VHDL. Different parts Part A: Input stimuli test bench Part B: Output analysis testbench Computer VHDL ”prototype” VHDL comp ”signal gener.” VHDL comp ”logic analyser” AB

15. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 15 Testbenches in VHDL. Input stimuli 1 Generation of input signals: stim1<= ’1’ after 5 ns, ’0’ after 100 ns, ’1’ after 200 ns, ’0’ after 300 ns; reset<=’1’, ’0’ after 50 ns; Generation of clock signal: signal clk: std_logic:=’0’; -- must be set to start value. constant period: time:=100 ns; ………. clk <= not clk after period/2; -- 10 MHz clock Synchronized inputs: process begin wait until clk=’1’; in_signal1<=’1’; in_signal2<=’0’; wait until clk=’1’; in_signal1<=’0’; in_signal2<=’1’; end process;

16. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 16 Testbenches in VHDL Input stimuli 2 Waveform generators: An alternative is to use a waveform generator to create input stimuli. ROM clock step stimuli subtype rom_word is std_logic_vector(3 downto 0); type rom_table is array (0 to 7) of rom_word; constant rom: rom_table:=( ”0100”, ”1100”, signal wave: rom_word; …. wave<=rom(conv_integer(step)); stim1<=wave(0); stim2<=wave(1);

17. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 17 Testbenches in VHDL Output check Check of output signals: Use assert to send messages and stop simulations at errors. Use wait until clk=’1’ to synchronize to clock. process begin if a=’1’ and b=’1’ then assert false report ”a and b violation” severity error; end if; wait until clk=’1’; end process;

18. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 18 Testbenches in VHDL. Different levels Class 1:Direct signal assignment. Text IO or waveform generator generates inputs. Class 2:Outputs are functionally checked with e.g. wait for 50 ns or wait until clk=’1’. Report result with assert command or special check signal. Class 3:Timing violation is tested. Can only be done on gate level simulation. Example: wait for 50 ns; if not q’stable(15 ns) then assert false report ”Setup timing violation on q” severity Warning; end if;

19. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 19 Testbenches in VHDL. Testvectors Testvectors are a set of input and output data that is used both for functional verification during development and for chip test during fabrication (only for ASIC). Testvectors are handled by the testbench. Testvectors are used both for behavioral and gate level verifications.

20. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 20 Testbenches in VHDL. Pull Up/Down A pull up/pull down can be represented by ’H’ and ’L’ respective. If a component has an inout pin the testbench can handle the pull up. entity test_bench is end; architecture tb of test_bench is component etu is port(enax: in std_logic; iox: inout std_logic); -- resolved!!! end; signal ena, io: std_logic; begin u1: etu port map(ena=>enax, io=>iox); io<=’H’; -- pull up ena<=’0’, ’1’ after 100 ns, ’0’ after 150 ns; io<=’0’, ’Z’ after 100 ns, ’0’ after 150 ns; end tb; entity etu is port(ena: in std_logic; io: inout std_logic); end; architecture rtl of etu is signal ena, io,a: std_logic; begin io<=a when ena=’1’ else ’Z’; end rtl;

21. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 21 Testbenches in VHDL Behavioural description! When writing testbenches you are not restricted to use the subset of VHDL that can be synthesised!

22. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 22 Signals or variables? In testbenches ( and in VHDL-models that shall not be synthesized it’s better to use variables: –Much faster simulations –Less memory is required

23. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 23 Design Synchronizing of FSMs and external events TimerFSM clk bitclk outp<='0' S3 S2 S1reset='1' outp<='0' outp<='1' bitclk='1' T bitclk T clk

24. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 24 Synchronization of processes Strobe method –Compare to synchronization with timer on previous slide –Generate a strobe as a “one clock pulse” –Processes must be synchronous (have the same clock and little “skew”) Hand shaking –To be used if the clocks are not synchronous

25. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 25 Synchronization. Strobe Stb<=‘1’ Stb=‘0’ Stb<=‘0’ Stb=‘1’ synch

26. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 26 Design Synchronizing of FSMs and external events 1 entity timer is port(clk,reset: in std_logic; bitclk: out std_logic); end; architecture rtl of timer is signal cntr: integer range 0 to 9; begin process(reset,clk) begin if reset=’1’ then cntr<=0; bitclk<=’0’; elsif clk’event and clk=’1’ then if cntr=0 then bitclk<=’1’; else bitclk<=’0’; end if; if cntr=9 then cntr<=0; else cntr<=cntr+1; end if; end process; end rtl;

27. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 27 Synchronization. Hand shaking Process AProcess B Req=‘1’ Ack=‘1’ Req=‘0’ Ack=‘0’ Ack<= ‘0’ Req=‘0’ Ack<= ‘1’ Req=‘1’ Ack<= ‘0’ Req=‘0’

28. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 28 Design. Meta stability 1 Meta stability may occur when data is changing on the clock edge. The output decision of the latch or register is arbitrary. This problem will be found when data and clock are not synchronized e.g. inputs that shall be read by state machines. When a latch/register is meta stable the subsequent circuitry can interpret the output of the latch as two different values (setup and hold time violations). clk data output 0 1 data output clk

29. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 29 Design. Meta stability 2 Some FPGAs are very sensitive to Meta stability. Use synchronizing mechanism to avoid problems. D Q C R D Q C R /Q input clk reset & rising edge pulse

30. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 30 Design. Synchronizing of FSMs and external events 2. Synchronizer FSM clk i_synch input T clk input

31. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 31 Design Synchronizing of FSMs and external events 2. entity synchronizer is port(clk,reset,input: in std_logic; i_synch: out std_logic); end; architecture rtl of synchronizer is begin process(reset,clk) begin if reset=’1’ then i_data<=’1’; elsif clk’event and clk=’1’ then q1<=input; q2<=q1; q3<=q2; end if; end process; i_synch<=q2 and not q3; end rtl;

32. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 32 Xilinx Spartan FPGA 1 CLB (Configurable Logical Block) in Spartan series clk G- LUT F- LUT H- LUT FF

33. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 33 PLD structures PAL Macrocell LUT AddrI1I2O1 0000 1101 2011 3110 O1= (I1 and not I2) or (not I1 and I2) LUT1(16*1 bit mem) LUT = LookUpTable 16 product terms /LUT O1 FF1 LUT1 IO LUT2 I1 I2 Programmable LUTs and programmable routing

34. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 34 CLB (Configurable Logical Block) in Spartan series Xilinx Spartan FPGA 2 clk 16* 1 RAM H- LUT FF Distributed RAM

35. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 35 CLB (Configurable Logical Block) in Spartan series Xilinx Spartan FPGA 3 clk 16* 1 RAM H- LUT FF Distributed RAM Spartan XCS10 has 196 CLBs => max 32*196 bits = 6272 if all CLBs are used for memory. ROM is the same as RAM but the content is stored when the FPGA is programmed.

36. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 36 CLB (Configurable Logical Block) in Spartan series Xilinx Spartan FPGA 4 clk 16* 1 RAM H- LUT FF Distributed RAM The HDL synthesis tool can infer (”dra slutsatsen”) that this shall be a distributed memory. The code must then be written a defined way.

37. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 37 Two methods to include ROM and RAM in a design: Instancing a technology specific ROM or RAM. Write VHDL code that is inferred (tolkad) to be a ROM or RAM. A RAM can also be implemented as registers (not efficient) Xilinx Spartan FPGA 5

38. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 38 architecture rtl of rom is constant rom_w: integer:=8; constant rom_l: integer:=4; subtype rom_word is std_logic_vector (rom_w-1 downto 0); type rom_table is array (0 to rom_l-1) of rom_word; signal rom: rom_type; begin q<=rom(conv_integer(addr)); end rtl; Xilinx Spartan FPGA 6 Inferred distributed ROM

39. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 39 architecture rtl of ram_test is type mem_type is array (7 downto 0) of std_logic_vector (3 downto 0)); signal mem: mem_type; begin q<=mem(conv_integer(addr)); process(clk, we,addr) if (rising_edge(clk) then if we=‘1’ then mem(conv_integer(addr))<=d; end if; end process; end rtl; Xilinx Spartan FPGA 7 Inferred distributed RAM Required

40. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 40 Xilinx Spartan FPGA 7 Inferred distributed RAM

41. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 41 Lab assignment 4 Design a CRC generator Design a testbench to test the CRC generator Use input data from a test and the testbench to verify the design. CRC generator clk ser_in reset_n crc_ok

42. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 42 Lab assignment 4 D Q C R =1 014511 12131415 Q11 =1 Q11 Q15 Q4 X1 ser_in clk reset q15 crc_ok & q0

43. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 43 Lab assignment 4. CRC entity crc is port(clk,reset,ser_in: in std_logic; crc_ok: out std_logic); end; architecture rtl of crc is signal crc_reg: std_logic_vector(15 downto 0); begin p1:process(clk,reset) -- synchronous process for shift register end process; p2:process(crc_reg) -- combinational process for crc_ok end process; end rtl;

44. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 44 Lab assignment 4. CRC testbench use std.textio.all; entity crc_tb is end; architecture behav of crc_tb is -- declare component crc -- declare signals constant period: time:= 100 ns; begin -- instantiate component crc as U1 -- clock and reset generation process file crc_file: text open read_mode is ”G:\VHDL\crc.txt”; variable text_line: line; variable inchar: character; begin -- read file and control input to crc end process; -- continues on next page

45. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 45 Lab assignment 4. CRC Testbench -- continues from previous page process begin -- count 48 pulses to crc -- assert to display crc_ok end process; end behav;

46. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 46 Lab assignment 4. Testbench constant period: time:=100 ns; begin reset<=’1’, ’0’ after period/4; clk<=not clk after period/2; …… end behav; wait until clk=’1’; readline(..); read(..); clk reset

47. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 47 Syntax: assert report severity if crc_ok=’1’ then assert false report ”crc ok” severity failure; else assert false report ”crc not ok” severity failure; end if; An assert message is sent if the condition is not met Lab assignment 4. Testbench stop simulator

48. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 48 - tb_exempel -- joal 2003-10-07 -- Abstract: To demonstrate how multiple drivers can be -- generated in a test bench and -- how to avoid problems with that LIBRARY ieee; USE ieee.std_logic_1164.ALL; USE ieee.std_logic_arith.ALL; -- *********************************************** LIBRARY ieee; USE ieee.std_logic_1164.ALL; USE ieee.std_logic_arith.ALL; ENTITY tb_exempel IS END tb_exempel ; ARCHITECTURE behav OF tb_exempel IS component tt_buffer is port(rd: in std_logic; out_buffer: inout std_logic_vector(7 downto 0)); end component; signal rd: std_logic; signal out_buffer: std_logic_vector(7 downto 0); BEGIN u1: tt_buffer port map (rd,out_buffer); process begin rd<='1'; wait for 500 ns; rd<='0'; wait; end process; process begin wait for 1 us; out_buffer<="10101010"; wait; end process; END behav; VHDL Test bench problem

49. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 49 - tb_exempel -- joal 2003-10-07 -- Abstract: To demonstrate how multiple drivers can be -- generated in a test bench and -- how to avoid problems with that LIBRARY ieee; USE ieee.std_logic_1164.ALL; USE ieee.std_logic_arith.ALL; -- *********************************************** LIBRARY ieee; USE ieee.std_logic_1164.ALL; USE ieee.std_logic_arith.ALL; ENTITY tb_exempel IS END tb_exempel ; ARCHITECTURE behav OF tb_exempel IS component tt_buffer is port(rd: in std_logic; out_buffer: inout std_logic_vector(7 downto 0)); end component; signal rd: std_logic; signal out_buffer: std_logic_vector(7 downto 0); BEGIN u1: tt_buffer port map (rd,out_buffer); process begin rd<='1'; wait for 500 ns; rd<='0'; wait; end process; process begin -- out_buffer driver in this process must have a start value – otherwise ’U’ is used and can't be resolved!!!! out_buffer<="ZZZZZZZZ"; wait for 1 us; out_buffer<="10101010"; wait; end process; END behav; VHDL Test bench problem

50. joal 2005 HT:1 Em3 Custom Designed Integrated Circuits 50 VHDL Test bench problem Before code corrected rd out_buffer UUUUUUUU10101010 After code corrected rd out_buffer 0101010110101010 1  s