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Berkeley Lab IH Monitoring Issues at Accelerators Jim Floyd Advanced Light Source LBL
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Berkeley Lab Chemical monitoring in user facilities Staff vs. Users Similar Exposure Groups (SEGs) for Users
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Berkeley Lab Engineered Nanomaterials Notice N456.1 “Using best available hazard information, conduct exposure assessment for all nanotechnology activities involving UNP.” Sampling issues —Desire to use real-time particle counters Signal to noise problems Establishing technical bases
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Berkeley Lab Example Collect Particle counts and filters from: both the source material and the work observation Analyze filters by microscopy and bulk analytical methods
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Berkeley Lab Nano example
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Berkeley Lab Nano example Nanostructures consistent with the source material accounted for ~0.3 particles/cc Nanoparticles/nanostructures not consistent with the source material accounted for ~40 particles/cc
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Berkeley Lab Nano Sampling —Developing this technical basis at our nano science center —Hope to be able to apply it at elsewhere Standards —Carbon nanotube (CNTs)
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Berkeley Lab Lasers Baseline eye exams —Standard practice —Acceptance of third-party exams (“portability”) —Exemptions if under escort
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Berkeley Lab Other non-ionizing radiation Magnetic fields —5 gauss work areas RF UV
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Berkeley Lab Noise Most work is well below below ACGIH thresholds —85 dBA (for 8 hours) But ubiquitous “nuisance noise” —Starting to use Preferred Speech Interference Level (PSIL) for guidance on prioritizing mitigations. —72 dB (at 500, 1000, 2000 Hz)
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Berkeley Lab Oxygen Deficiency Standardized application for accelerator tunnels, etc. (FNAL, et al.) Application to lab environments is a little tricky
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Berkeley Lab The Usual Suspects Peeling Lead Paint on DomeSoldering Station
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