1. Technion – Israel Institute of Technology Department of Electrical Engineering Spring 2009 Instructor Amit Berman Students Evgeny Hahamovich Yaakov Aharon JTool Poster

2. Project Objectives Understanding Jitter analysis methodology and background Design and implement software for calculating Jitter parameters based on Agilent’s scope measurements Analyze Jitter for user created, pre-known pattern Analyze Jitter for high-speed printed circuit board Compare the method to other popular jitter measurement tools 2

3. Block Diagram Data Input *.csv format Zero Crossing TIE Jitter Trend Histogram Eye Diagram Bathtub Curve Jitter Extrapolation PDF CDF TJ@BER Jitter FFT PJ RMS DJ p-p Numerical Output Graphical Output Internal Function Initial Parameters TIE Filter Jitter Separation Conf. Level Shortening RJ RMS

4. JTool User interface Graphical User Interface implemented using “GUIDE” tool in MATLAB 4 JTool

5. JTool Results 5

6. Correlation on High Speed Boards Data Pattern 1.25GHz (2.5Gbits) data pattern, Vp-p = 1.2V, Vcm = 0V Signal generated using Intel’s chip and board Signal captured using DSO91304A Agilent Scope (different model) Fsample = 40Gsa/s, 2Mpts samples taken 6 TIE P-P = 163 ps TIE P-P = 170 ps