1. Built-In Self Test (BIST)

2.  1. Introduction  2. Pattern Generation  3. Signature Analysis  4. BIST Architectures  5. Summary Outline

3. Built-In Self Test (BIST)   1. Introduction  2. Pattern Generation  3. Signature Analysis  4. BIST Architectures  5. Summary

4. Built-In Self Test (BIST) 1. Introduction

5. Built-In Self Test (BIST) 1. Introduction General Structure

6. Built-In Self Test (BIST) General Structure Unit Under Test Data Compressor Data Generator Comparator Display Reference BIST Controller Start/StopReady Electronic System 1. Introduction

7. Built-In Self Test (BIST) 1. Introduction

8. Built-In Self Test (BIST) 1. Introduction

9. Built-In Self Test (BIST) 1. Introduction

10. Built-In Self Test (BIST)   1. Introduction  2. Pattern Generation  3. Signature Analysis  4. BIST Architectures  5. Summary

11. Built-In Self Test (BIST) 2. Pattern Generation

12. Built-In Self Test (BIST) 2. Pattern Generation

13. Built-In Self Test (BIST) 2. Pattern Generation

14. Built-In Self Test (BIST) 2. Pattern Generation

15. Built-In Self Test (BIST) 2. Pattern Generation A fixed set of “optimal” test patterns, usually derived from fault simulation, is used.

16. Built-In Self Test (BIST) 2. Pattern Generation

17. Built-In Self Test (BIST) 2. Pattern Generation

18. Built-In Self Test (BIST) 2. Pattern Generation

19. Built-In Self Test (BIST) 2. Pattern Generation

20. Built-In Self Test (BIST) Pseudo-Random Generation using LFSR 2. Pattern Generation

21. Built-In Self Test (BIST) Example of a 4-bit LFSR as a Pattern Generator. Pseudorandom states generated by the LFSR. Pseudo-Random Generation using LFSR 2. Pattern Generation

22. Built-In Self Test (BIST)   1. Introduction  2. Pattern Generation  3. Signature Analysis  4. BIST Architectures  5. Summary

23. 3. Signature Analysis Built-In Self Test (BIST)

24. 3. Signature Analysis Built-In Self Test (BIST) Methods for Response Evaluation Steps for Response Evaluation: 1 2 3 

25. r-Bit (Internal XOR) Signature Generator. The content of the LFSR is the remainder of the division operation. 3. Signature Analysis Serial Built-In Self Test (BIST)

26. r-Bit (External XOR) Signature Generator. The content of the LFSR is not the remainder of the division operation. Serial 3. Signature Analysis

27. Serial Example of a 4-bit (External) Signature Generator. Built-In Self Test (BIST) 3. Signature Analysis

28. r-Bit (Internal XOR) Parallel Signature Generator. r-Bit (External XOR) Parallel Signature Generator. Parallel Built-In Self Test (BIST) 3. Signature Analysis

29. Problem: fault masking When compacting results, there is a probability of fault masking ! Probability of failing to detect an error in the response sequence: Serial input Parallel input Where: K: length of the sequence (# of bits) r: length of the LFRS (# of bits) 2 mL- r – 1 2 mL – 1 2 k-r – 1 2 k – 1 Where: L: length of the sequence (# of test vectors) m: length of a vector (# of bits) r: length of the LFRS (# of bits) Built-In Self Test (BIST) 3. Signature Analysis

30. Built-In Self Test (BIST) 3. Signature Analysis Modular LFSR Serial Compacter Example

31. Built-In Self Test (BIST) 3. Signature Analysis Modular LFSR Parallel Compacter Example

32. Built-In Self Test (BIST)   1. Introduction  2. Pattern Generation  3. Signature Analysis  4. BIST Architectures  5. Summary

33. Built-In Self Test (BIST) 4. BIST Architectures Built-In Logic Block Observer (BILBO)

34. 4. BIST Architectures Built-In Self Test (BIST)

35. Modular Bus-Oriented Design with “BILBO”. Built-In Self Test (BIST) 4. BIST Architectures Built-In Logic Block Observer (BILBO)

36. 4. BIST Architectures Built-In Self Test (BIST)

37. 4. BIST Architectures General Form of a BILBO B1 = 1, B2 = 1: S.A. B1 = 1, B2 = 0: Normal Op. B1 = 0, B2 = 0: Scan B1 = 0, B2 = 1: P.G. MUX: B2 = 1: Out = Q1. B2 = 0: Out = Sin.

38. Example: 8-bit-Length Datapath Built-In Self Test (BIST) 4. BIST Architectures B1 = 1, B2 = 0: S.A. B1 = 1, B2 = 1: Normal Op. B1 = 0, B2 = 0: Scan B1 = 0, B2 = 1: Not Ap. MUX: B1 = 1: Out = Q1. B1 = 0: Out = Sin.

39. Built-In Self Test (BIST) Example: 8-bit-Length Datapath 4. BIST Architectures

40. Built-In Self Test (BIST) Example: 8-bit-Length Datapath 4. BIST Architectures

41. Built-In Self Test (BIST)   1. Introduction  2. Pattern Generation  3. Signature Analysis  4. BIST Architectures  5. Summary

42. Built-In Self Test (BIST)