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ECE 875: Electronic Devices Prof. Virginia Ayres Electrical & Computer Engineering Michigan State University ayresv@msu.edu
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VM Ayres, ECE875, S14 Lecture 41, 21 Apr 14 Chp 14: Sensors Chemical ion sensors Temperature sensors Mechanical sensors
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VM Ayres, ECE875, S14 What has changed from a conventional MOSFET: Gate Insulator Channel Substrate
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VM Ayres, ECE875, S14 How to incorporate the changes: examine conventional MOSFET: Below velocity saturation = ms : missing Q f /C ox
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VM Ayres, ECE875, S14 Conventional MOSFET: = ms : missing Q f /Cox
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How to incorporate the changes: replacing metal gate with ion-rich solution:
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VM Ayres, ECE875, S14 _ _ _ + + + Dipole layer on solution side “talks” to semiconductor at its insulator surface Dominated by effect of dipole layer missing Q f /C ox
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VM Ayres, ECE875, S14 Work function difference change:
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Main question is: ? Hidden question is: ?
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Main question is: find I Dsat Hidden question is: find V T <= find V FB
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VM Ayres, ECE875, S14 Lecture 41, 21 Apr 14 Chp 14: Sensors Chemical ion sensors Temperature sensors Mechanical sensors
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Concentrations of carriers are temperature dependent: Chp. 01
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Goal: use temperature effects within a device for readout: Choices:pn junction MOSFET
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Goal: use temperature effects within a device for readout: Choices:pn junction MOSFET What can change as a function of temperature?
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n i is related to the energy bandgap and energy bandgaps are temperature dependent Chp. 01
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Goal: use temperature effects within a device for readout: Choices:pn junction MOSFET
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Chp.01 Simplify the mathematics: 2 = small:
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This is I as a readout as as function of V = V ext : an I-V graph with a “camouflaged” temperature dependance
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Use voltage readout for better sensitivity:
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In HW09: Pr. 01:
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