Presentation is loading. Please wait.

Presentation is loading. Please wait.

System and Irradiation Tests on the GOL chip.

Similar presentations


Presentation on theme: "System and Irradiation Tests on the GOL chip."— Presentation transcript:

1 SMU Activities Jingbo Ye May 9, 2005, CERN, for Opto-Electronics Readout Systems for SLHC.
System and Irradiation Tests on the GOL chip. LoC (link on chip) development based on SoS technology.

2 GOL chip GOL: 1.6 Gbps serializer + laser driver in one chip, 0.5m CMOS technology with radiation tolerant layout. Works with HDMP-1024 and TLK2501 as deserializer. System tests carried out by CERN and experiments that plan to use this chip. Irradiation tests so far: 10 Mrad(SiO2) with 10KeV X-rays, 3.14×1012p/cm2, 60MeV proton, no SEU observed.

3 System and Irradiation tests of the GOL chip planned at SMU
System test: GOL clock jitter tolerance with HDMP-1024 or TLK2501 as deserializer. GOL clock jitter conversion from the reference clock to the serial data stream. GOL driving characteristics with a VCSEL and with an Edge Emitting Laser. Irradiation test: 200 MeV proton with fluences up to 1015 – 1016 p/cm2. Co-60 gamma, if necessary to 50 Mrads. We plan to carry out these tests in year 05 and 06.

4 Optical Data Links using CMOS Silicon-on-Sapphire (SoS) Technology
For the LoC development, let me borrow a presentation we made at Nevis. Optical Data Links using CMOS Silicon-on-Sapphire (SoS) Technology Ping Gui, Jingbo Ye, Ryszard Stroynowski Southern Methodist University March 07, 2005

5 Outline Silicon-on-Sapphire technology
CMOS Transceiver IC Design Experience Proposed single-chip approach

6 Peregrine’s Silicon-on-Sapphire (SoS) Ultra-Thin-Silicon-on-insulator (UTSi) Technology
Considered to be radiation hard No latch-up Reduced Parasitic capacitance High performance Low Power consumption Minimum crosstalk Higher level integration Allow for compact and simple integration with optical devices Substrate is transparent Widely used in RF and space products

7 Flipped OE devices on UTSi substrate
flip chip attachment UTSi integrated photo detector UTSi integrated circuitry VCSEL driver circuitry receiver circuitry quad VCSEL array quad PIN array active CMOS layer 200 um transparent sapphire substrate (UTSi) MMF ribbon fiber Flip-chip bonding of OE devices to CMOS on sapphire No wire-bonds – package performance scales to higher data rates Rugged and compact package

8 Peregrine Space Product 4+4 Transceiver
MTP Connector Module 0.5-um UTSi SoS Single 4+4 transceiver component with variable data rates (CML interface) Minimum data rate – 10 Mbps Maximum data rate – 2.7 Gbps per channel Radiation Total Ionizing Dose: 100 kRad(Si) SEU: > 20 MeV-cm2/mg 15 year operational lifetime 125 mW per channel power consumption (dissipated to panel mount) Vibration 15.33 gRMS for 3 minutes total 15 mm height Berg MegArray PCB socket

9 SoS CMOS v.s. Bulk CMOS 0.25 m SoS (UTSi) 0.13 m Bulk CMOS
Performance 10 GHz Leakage Current Substrate as an insulator (1014 ohm/m at room temperature). Reduced substrate junction capacitance leads to lower leakage current. High Leakage current Power Dissipation Reduced parasitic capacitance also leads to a lower power dissipation Crosstalk Minimum crosstalk due to reduced substrate capacitance Substrate noise causes crosstalk between channels Cost $100k for wafer mask set; $1000 per wafer $800k for wafer mask set; $800 per wafer

10 CMOS IC design experience

11 IC Design using UTSi technology
Performance: 4-channel optoelectronic transceiver 0.6Gb/s Performance: 4-channel optoelectronic transceiver 2-3Gb/s Performance: 4-channel optoelectronic transceiver 3-4Gb/s Innovation: Double Data Rate transceiver Innovation: Dual-rate (power-performance trade off) Innovation: Instant power-up/down DARPA OE-center DARPA PCA/RATS DARPA C2OI 0.5 m CMOS Silicon-on-Sapphire Technology

12 ASIC 1:Source Synchronous Double Data Rate Transceiver
4 optical link each at 622Mbp/s transmitter receiver Features: Source synchronous design; clock is sent along with data over the optical channels No-PLL based clock recovery circuits are needed. Efficient channel use by Double Data Rate(DDR) Scalable to multiple channels Adjustable transmitter power and receiver gain Fully tested at 0.6Gbps per channel Data rate limited by CMOS I/O 8:1 serializer VCSEL driver Photo Detect 1:8 deserializer Din(7:0) data1 Dout(7:0) clock1 Din(15:8) clock2 Dout(15:8) 8:1 serializer 1:8 deserializer data2 ClkIn (78MHz) ClkOut (78MHz) clk4x (311MHz) (b) chip architecture Transmitter digital circuits 1*4 PD array & receiver ckt Receiver digital circuits 1*4 VCSEL array & driver circuit. (a) Chip microphotography

13 ASIC2: Parallel Optical Links with instant power-up/down capability
CML IN Driver ckt. & VCSELs PD & Receiver CMLOUT Drv Ch 1 Ch 2 Ch 3 Ch 4 Ch 1 Ch 2 Ch 3 Ch 4 Drv Drv Drv TX Power on RX Power on Channel is able to power-down/up within 3 nanoseconds Individual power-down control for every channel adjustable bias and modulation current controlled by on-chip digital registers Data rate at 2.5Gbps

14 System Integration front view of the CMOS chip with PIN
Back view of the CMOS chip with VCSEL Free-space optical Link 4 x 1 RX IC Hybrid COB 4 x1 TX IC Hybrid COB GHz bypass connectors FR4 mother- board Xilinx FGPA controller Gigabit test-bed

15 Measurement Results 2-Gb/s 2.5-Gb/s 3-Gb/s

16 Instant On/off optical link demonstration
PWR_ON_SIGNAL 500ps PWR_OFF_SIGNAL 2-Gbps VCSEL power-on/off eye 2-Gbps link (tx+rx) power-on/off eye

17 Link Performance for Continuous Operation
Eye diagrams: Link eye diagram measured after 11 hours of 2-Gbps (a) Normal operation (b) At worst case scenario BER measurement: No errors after running for 11 hours continuously. Bit Error Rate < 1E-14

18 Recent Design submission using 0.25um Technology
Free fabrication and flip-chip bonding service Sponsored by OIDA/PTAP program Two types of Driver circuits designed VCSEL driver circuit GSE driver circuit With simulation results GDS submitted on 02/08/05 Non-gold bumped die shipped on 05/31/05 Gold bumped die shipped on 06/20/05 Flip-chip bonded OE devices shipped on 07/15/05

19 Simulation Results GSE driver 6.25-Gbps/channel Bias: up to 40mA
Modulation current: 40 mA 160ps 60ps VCSEL driver 15-Gb/s/channel Bias: ~ 1mA Modulation:~ 5mA Data rate can be pushed higher by using inductors peaking

20 Proposed Single-chip Approach-- integrating SerDes, Transceiver and OE Devices
10G Transceiver Module Parallel Data Photonic RX De- seriliazer Decoder Optical data TIA/LA RXREGclock PIN Clock/Data recovery clock is embedded in the serial data stream Flip-chip bonding PLL REFclock VCSEL seriliazer encoder Driver Parallel Data TX Improve performance No off-chip high speed lines Flip-chip bonding reduce capacitance and inductance Reduce power consumption No 50-Ohm transmission lines between chips

21 Support from Peregrine
Peregrine is highly interested in collaboration We have access to their advanced fabrication technology $30k for 3mmx3mm MPR $15k for Flip-chip bonding service Technical Support

22 Q & A Thank you !


Download ppt "System and Irradiation Tests on the GOL chip."

Similar presentations


Ads by Google