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Mixed-Signal Option for the Teradyne Integra J750 Test System

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Presentation on theme: "Mixed-Signal Option for the Teradyne Integra J750 Test System"— Presentation transcript:

1 Mixed-Signal Option for the Teradyne Integra J750 Test System
Group:May08-12 Emily Evers Vincent Tai

2 Team Leader: Emily Evers
Communications Coordinator: Vincent Tai Advisor: Dr. Weber Client: ECpE Department

3 Requirement Specification
Problem Statement Concept Sketch System Block Diagram System Description User Interface Description Research Requirements Deliverables

4 Problem Statement The Teradyne system has been updated to allow for analog circuits to be tested. Although the tester is capable of testing analog circuits, there is no easy to use documentation and test procedures for the mixed-signal option.

5 Concept Sketch Daughterboard Socket Converter Teradyne J750
IG-XL Software

6 System Block Diagram Devices Mapping of DIB and Dautgherboard
IX-GL Software Testing Documentation

7 System Description Devices Mapping Analog-to-Digital Converters
Digital-to-Analog Converters High Speed Op Amp Mapping Device Interface Board (DIB) Connects daughter board to tester via pogo pins Daughter Board Connects device to DIB

8 System Description IX-GL Software Testing Documentation Test Plan
Pin and Channel Map AC and DC Specs Timing Pattern Testing Documentation

9 Users Electrical and Computer Engineering Faculty
Graduate Students interested in IC testing Students in EE 418

10 User Interface Description
IG-XL Software

11 Market and Literary Research
Previous Groups Work Previous Cookbooks Current Documentation of Project Progress Website Teradyne Lab Materials Digital Lab Books Mixed-Signal Option Lab Books Teradyne Website

12 Risks and Risk Management
Risk: New Program maybe hard to learn Risk Management: Read Teradyne Manuals and Previous Risk: Limited team members Risk Management: Time Management

13 Functional Requirements
The cookbook will be written so that a new user can understand The testing instructions will cover five different devices Two Analog-to-Digital converters Two Digital-to-Analog converters High Speed Op-amp Only one device will be tested at a time A test program will be created for the devices using IG-XL and will allow for easy manipulation for similar devices Upon successful testing and mating of the devices a cookbook will be made to allow future users to test these devices The project will be easy to trouble shoot using proper documentation

14 Non-functional Requirements
The room environment needs to be kept at a consistent temperature of 30°C ± 3° Electrostatic discharge wrist bands must be worn when using the tester Access is limited to the lab

15 Deliverables DIB and Daughterboard Mapping
Functioning IG-XL code for each device Completed testing for all devices Documentation for all devices

16 Deliverables Weekly Reports Website Project Plan Design Plan
Final Report

17 Project Plan Work Breakdown Structure Resource Requirements
Project Schedule

18 Work Breakdown Structure
Review Status Look over previous groups work Read Teradyne training manuals External Mapping DIB mapping Daughterboard mapping

19 Work Breakdown Structure
Create Test Plan Use IG-XL software Run Tests Successfully Write Cookbook

20 Resource Requirements
Time Requirements Review Status IC Interface Test Plan Development Testing Documentation Reporting Total Hours Evers, Emily 30 50 100 75 60 40 355 Tai, Vincent Total 200 150 120 80 710 Financial Requirements Item Cost Materials Poster $35.00 Daughterboard TBA Subtotal Labor ($10.00/hour) Emily Evers $ Vincent Tai $ Total

21 Project Schedule

22 Thank You Questions?


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