1. Atomic Force Microscope Nanoindentation/Scratching

2. Nanoindentation/Scratching
Elastic & plastic material properties are obtained from load-displacement data, but knowledge of the true area of contact is critical.
sink-in
Load (µN)
Stiffness, S:
(nm)
pile-up

3. Indentation is Possible With F/D Curves
Tip moving in
Tip moving out C D A B F E A B C D E F

4. AFM Nanoindenting
Problems With AFM: a) The probe geometry (area) is not know, not quantitative
b) The probe motion is not horizontal at contact.

5. AFM Scratching
When Scratching With the AFM, there is a torsion on the cantilever so the probe area changes.

6. AFM Image of nanoindents in a surface.
Nanoindentation Characterization
The AFM is ideal for characterizing nanoindents and nano scratches in a surface.
AFM Image of nanoindents in a surface.

7. Summary
All AFM instruments can create nanoindents and nanoscratches in a surface.
The technique is not quantitative because the probe/surface angle is not characterized
The AFM is useful for characterizing nanoindents and nanoscratches.