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Lecture7 –More on Attacks Rice ELEC 528/ COMP 538 Farinaz Koushanfar Spring 2009
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Outline More on side-channel attacks Fault injection attacks Generic attacks on cryptosystems Slides are mostly courtesy of Michael Tunstall michael.tunstall@gemplus.com
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Simple power analysis (SPA) - example
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SPA example (cont’d)
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Unprotected modular exponentiation – square and multiply algorithm
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Possible counter measure – randomizing RSA exponentiation
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Statistical power analysis Two categories –Differential power analysis (DPA) –Correlation power analysis (CPA) Based on the relationship b/w power consumption & hamming weight of the data
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Modeling the power consumption Hamming weight model –Typically measured on a bus, Y=aH(X)+b –Y: power consumption; X: data value; H: Hamming weight The Hamming distance model –Y=aH(P X)+b –Accounting for the previous value on the bus (P)
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Differential power analysis (DPA) DPA can be performed in any algo that has operation =S( K), – is known and K is the segment key The waveforms are caotured by a scope and Sent to a computer for analysis
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What is available after acquisition?
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DPA (cont’d) The bit will classify the wave w i –Hypothesis 1: bit is zero –Hypothesis 2: bit is one –A differential trace will be calculated for each bit!
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DPA (cont’d)
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DPA -- testing
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DPA – the wrong guess
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DPA (cont’d) The DPA waveform with the highest peak will validate the hypothesis
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DPA curve example
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DPA (cont’d)
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Attacking a secret key algorithm
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Typical DPA Target
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Example -- DPA
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Example – hypothesis testing
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DPA (Cont’d)
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DPA on DES algorithm
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DPA on other algorithms
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Correlation power analysis (CPA) The equation for generating differential waveforms replaced with correlations Rather than attacking one bit, the attacker tries prediction of the Hamming weight of a word (H) The correlation is computed by:
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Statistical PA -- countermeasures
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Anti-DPA countermeasures
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Anti-DPA Internal clock phase shift
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DPA summary
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Electromagnetic power analysis
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EMA – probe design
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EMA signal
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Spatial positioning
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Example: SEMA on RSA
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EMA (cont’d)
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Counter measures
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Fault injection attacks
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Fault attacks
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Fault injection techniques Transient (provisional) and permanent (destructive) faults –Variations to supply voltage –Variations in the external clock –Temperature –White light –Laser light –X-rays and ion beams –Electromagnetic flux
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Need some (maybe expensive equipment) – eg, laser
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Fault injection steps
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Provisional faults Single event upsets –Temporary flips in a cell’s logical state to a complementary state Multiple event faults –Several simultaneous SEUs Dose rate faults –The individual effects are negligible, but cumulative effect causes fault Provisional faults are used more in fault injection
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Permanent faults Single-event burnout faults –Caused by a parasitic thyristor being formed in the MOS power transistors Single-event snap back faults –Caused by self-sustained current by parasitic bipolar transistors in MOS Single-event latch-up faults –Creates a self sustained current in parasitics Total dose rate faults –Progressive degradation of the electronic circuit
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Fault impacts (model) Resetting data Data randomization – could be misleading, no control over! Modifying op-code – implementation dependent
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Fault attacks – counter measures
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Attacks on systems using smart cards
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Trusted path Normal key validation on a PC
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Trusted path PIN code validation – can you come up with attacks?
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Are smart cards good or bad?
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Let’s go thru a few common scenarios
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A few common scenarios…
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Example – fault attack on DES
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15-th round DPA
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15-th round DES
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