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OL ILDLOEM BIT/Integrated Diagnostics Test / Maintenance Feedback ARGCS ACTD CONOPS Weapon System ECP Data flow Coalition Team Concept Wide.

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Presentation on theme: "OL ILDLOEM BIT/Integrated Diagnostics Test / Maintenance Feedback ARGCS ACTD CONOPS Weapon System ECP Data flow Coalition Team Concept Wide."— Presentation transcript:

1 OL ILDLOEM BIT/Integrated Diagnostics Test / Maintenance Feedback ARGCS ACTD CONOPS Weapon System ECP Data flow Coalition Team Concept for @world Wide Support

2 Northrop Grumman ARGCS Solution

3 TestStation Instrument TestAdaptor TestConfiguration TestDescription TestResults UUTData Diagnostics TestProgram Not Started Candidate Not Included Draft Started (Web) Services ATML Elements

4 UUT Repair Process Bit CheckObservationO levelI levelD level UUTData Diagnostics TestResults (Results & Diagnosis)TestDescription

5 ATML Framework 12 Jan 05

6 Exte rnal Inter face (UI) Test Contr oller Rea son er Dat a Stor e App Exe c Test Desc riptio n UUT static Tes t Res ults Test Confi g UUT static Tes t Res ults Test Desc riptio n UI Application Ex Test Executive Reasoner IO Local (Test Results) Diagnostics [1232] Outside ATML ATML AB C D E

7 Condensation of Architectures Common Features Test Controller or Test Executive Application Executive Historical Database Data store (metadata)

8 Condensation of Architectures Application Executive Test Controller Interface (Adapter?) User Interface UUT Diagnostic Interface Reasoner Fault Tree BIT Historical DB Static DB PIREP Technician knowledge Contains UUT data, test descriptions, instrument metadata Contains prior test results for UUT, operator knowledge base (?)

9 A time line that test results may go through. Start with a simple list of test that we want to perform Each test is performed and a measurement is captured A set of limits is applies to each test consistent with the design authority field test requirements, which may be different from the depot level. The pass/fail criteria is determined from the limits supplied The grouping pass/fail criteria is determined The pass/fail limits and measurements are filtered out as a security measure The test and pass/fail information is diagnosed to identify indictments and subsequent repair.

10 How will Test Description define Test Limits? Simple, there’s a common type TestLimits just use that. What happens if your TestDesription wants to reference an previous run? Oh allow for XPath & XLink How do you define a group of test? Ahhh More importantly how do we know we have to? How do we ensure our Requirement specifications in Test Description can be met from our Instrument descriptions?

11 What’s happening with?  - Design - Preconditions & Postconditions, Initialization & Termination (Ion Neag)  - Design - Test Actions (Ion Neag)  - A couple of use case scenarios (Dan Pleasant) Supporting Both Static and Dynamic descriptions? (Chris Gorringe) What Will Services mean? (Chris Gorringe) XML Transaction Presentation (Tony Alwardt)

12 What’s Next?

13 Web Services TestStation Instrument TestAdaptor TestConfiguration TestDescription TestResults UUTData Diagnostics TestProgram Not Started Candidate Not Included Draft Started DIAD DIAS TPD DTF MTD MCI AFP IFPSFP PDD UTR UDI BTD MMF DRV FRM DNE NET ICM CXE RAI RMS SWM CTI RTS MTD ATML/ARI KEY Elements (Web) Services

14 INFORMATION FRAMEWORK SYSTEMS INTERFACES DoD ATS Technical Framework & ATML Relationships Multimedia Formats MMF (JTA) Diagnostic Data DIAD (IEEE 1232) Digital Test Format DTF (IEEE 1445) Test Program Documentation TPD Maintenance Data and Services MTD (IEEE P1636) Diagnostic Services DIAS (IEEE 1232) Adapter Functional & Parametric Data AFP (IEEE P1641) Switch Matrix SWM Common Test Interface CTI (IEEE P1505) Run Time Services RTS IVI/Resource Adapter Interface RAI (IEEE P1641) Instrument Driver DRV (VPP 3-X) Communication Manager ICM (VPP-4) Instrument Functional & Parametric Data IFP/SFP (IEEE P1641) System Framework FRM (VPP-2) UUT Test Requirements UTR (IEEE P1641) Built In Test Data BTD (IEEE 1149.X) Product Design Data PDD UUT Device Interfaces UDI Computer to External Env. CXE (TCP/IP) Data Networking NET (TCP/IP) Resource Management Services RMS Data/ Distributed Network DNE LEGEND Commonly accepted commercial standard Commercial std under review/evaluation Commercial std not yet selected/developed Test Description Diagnostics Interface Adaptor Instrument Interface Adapter UUTData Master Conformance Index MCI Test Program Set Diagnostics IEEE P1671 ATML Initiative Test Station UUTData Test Description UUTData Test Description

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