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EE141 © Digital Integrated Circuits 2nd Devices 1 Digital Integrated Circuits A Design Perspective The Devices Jan M. Rabaey Anantha Chandrakasan Borivoje Nikolic July 30, 2002
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EE141 © Digital Integrated Circuits 2nd Devices 2 Goal of this chapter Present intuitive understanding of device operation Introduction of basic device equations Introduction of models for manual analysis Introduction of models for SPICE simulation Analysis of secondary and deep-sub- micron effects Future trends
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EE141 © Digital Integrated Circuits 2nd Devices 3 The Diode Mostly occurring as parasitic element in Digital ICs
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EE141 © Digital Integrated Circuits 2nd Devices 4 Depletion Region
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EE141 © Digital Integrated Circuits 2nd Devices 5 Diode Current
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EE141 © Digital Integrated Circuits 2nd Devices 6 Forward Bias Typically avoided in Digital ICs
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EE141 © Digital Integrated Circuits 2nd Devices 7 Reverse Bias The Dominant Operation Mode
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EE141 © Digital Integrated Circuits 2nd Devices 8 Models for Manual Analysis
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EE141 © Digital Integrated Circuits 2nd Devices 9 Junction Capacitance
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EE141 © Digital Integrated Circuits 2nd Devices 10 Diffusion Capacitance
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EE141 © Digital Integrated Circuits 2nd Devices 11 Secondary Effects –25.0–15.0–5.05.0 V D (V) –0.1 I D ( A ) 0.1 0 0 Avalanche Breakdown
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EE141 © Digital Integrated Circuits 2nd Devices 12 Diode Model
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EE141 © Digital Integrated Circuits 2nd Devices 13 SPICE Parameters
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EE141 © Digital Integrated Circuits 2nd Devices 14 What is a Transistor? A Switch! |V GS | An MOS Transistor
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EE141 © Digital Integrated Circuits 2nd Devices 15 The MOS Transistor Polysilicon Aluminum
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EE141 © Digital Integrated Circuits 2nd Devices 16 MOS Transistors - Types and Symbols D S G D S G G S DD S G NMOS Enhancement NMOS PMOS Depletion Enhancement B NMOS with Bulk Contact
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EE141 © Digital Integrated Circuits 2nd Devices 17 Threshold Voltage: Concept
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EE141 © Digital Integrated Circuits 2nd Devices 18 The Threshold Voltage
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EE141 © Digital Integrated Circuits 2nd Devices 19 The Body Effect
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EE141 © Digital Integrated Circuits 2nd Devices 20 Current-Voltage Relations A good ol’ transistor Quadratic Relationship 00.511.522.5 0 1 2 3 4 5 6 x 10 -4 V DS (V) I D (A) VGS= 2.5 V VGS= 2.0 V VGS= 1.5 V VGS= 1.0 V ResistiveSaturation V DS = V GS - V T
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EE141 © Digital Integrated Circuits 2nd Devices 21 Transistor in Linear
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EE141 © Digital Integrated Circuits 2nd Devices 22 Transistor in Saturation Pinch-off
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EE141 © Digital Integrated Circuits 2nd Devices 23 Current-Voltage Relations Long-Channel Device
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EE141 © Digital Integrated Circuits 2nd Devices 24 A model for manual analysis
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EE141 © Digital Integrated Circuits 2nd Devices 25 Current-Voltage Relations The Deep-Submicron Era Linear Relationship -4 V DS (V) 00.511.522.5 0 0.5 1 1.5 2 2.5 x 10 I D (A) VGS= 2.5 V VGS= 2.0 V VGS= 1.5 V VGS= 1.0 V Early Saturation
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EE141 © Digital Integrated Circuits 2nd Devices 26 Velocity Saturation (V/µm) c = 1.5 n ( m / s ) sat = 10 5 Constant mobility (slope = µ) Constant velocity
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EE141 © Digital Integrated Circuits 2nd Devices 27 Perspective I D Long-channel device Short-channel device V DS V DSAT V GS - V T V GS = V DD
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EE141 © Digital Integrated Circuits 2nd Devices 28 I D versus V GS 00.511.522.5 0 1 2 3 4 5 6 x 10 -4 V GS (V) I D (A) 00.511.522.5 0 0.5 1 1.5 2 2.5 x 10 -4 V GS (V) I D (A) quadratic linear Long Channel Short Channel
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EE141 © Digital Integrated Circuits 2nd Devices 29 I D versus V DS -4 V DS (V) 00.511.522.5 0 0.5 1 1.5 2 2.5 x 10 I D (A) VGS= 2.5 V VGS= 2.0 V VGS= 1.5 V VGS= 1.0 V 00.511.522.5 0 1 2 3 4 5 6 x 10 -4 V DS (V) I D (A) VGS= 2.5 V VGS= 2.0 V VGS= 1.5 V VGS= 1.0 V ResistiveSaturation V DS = V GS - V T Long ChannelShort Channel
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EE141 © Digital Integrated Circuits 2nd Devices 30 A unified model for manual analysis S D G B
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EE141 © Digital Integrated Circuits 2nd Devices 31 Simple Model versus SPICE V DS (V) I D (A) Velocity Saturated Linear Saturated V DSAT =V GT V DS =V DSAT V DS =V GT
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EE141 © Digital Integrated Circuits 2nd Devices 32 A PMOS Transistor -2.5-2-1.5-0.50 -0.8 -0.6 -0.4 -0.2 0 x 10 -4 V DS (V) I D (A) Assume all variables negative! VGS = -1.0V VGS = -1.5V VGS = -2.0V VGS = -2.5V
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EE141 © Digital Integrated Circuits 2nd Devices 33 Transistor Model for Manual Analysis
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EE141 © Digital Integrated Circuits 2nd Devices 34 The Transistor as a Switch
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EE141 © Digital Integrated Circuits 2nd Devices 35 The Transistor as a Switch
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EE141 © Digital Integrated Circuits 2nd Devices 36 The Transistor as a Switch
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EE141 © Digital Integrated Circuits 2nd Devices 37 The Sub-Micron MOS Transistor Threshold Variations Subthreshold Conduction Parasitic Resistances
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EE141 © Digital Integrated Circuits 2nd Devices 38 Threshold Variations V T L Long-channel threshold LowV DS threshold Threshold as a function of the length (for lowV DS ) Drain-induced barrier lowering (for lowL) V DS V T
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EE141 © Digital Integrated Circuits 2nd Devices 39 Sub-Threshold Conduction 00.511.522.5 10 -12 10 -10 10 -8 10 -6 10 -4 10 -2 V GS (V) I D (A) VTVT Linear Exponential Quadratic Typical values for S: 60.. 100 mV/decade The Slope Factor S is V GS for I D 2 / I D 1 =10
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EE141 © Digital Integrated Circuits 2nd Devices 40 Sub-Threshold I D vs V GS V DS from 0 to 0.5V
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EE141 © Digital Integrated Circuits 2nd Devices 41 Sub-Threshold I D vs V DS V GS from 0 to 0.3V
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EE141 © Digital Integrated Circuits 2nd Devices 42 Summary of MOSFET Operating Regions Strong Inversion V GS > V T Linear (Resistive) V DS < V DSAT Saturated (Constant Current) V DS V DSAT Weak Inversion (Sub-Threshold) V GS V T Exponential in V GS with linear V DS dependence
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EE141 © Digital Integrated Circuits 2nd Devices 43 Parasitic Resistances
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EE141 © Digital Integrated Circuits 2nd Devices 44 Latch-up
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EE141 © Digital Integrated Circuits 2nd Devices 45 Future Perspectives 25 nm FINFET MOS transistor
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