1. Bellerophon on Pegasus 02.12.20091S. Atieh RF structure development meeting

2. CMM’s under qualification 02.12.2009S. Atieh RF structure development meeting2 Metrology news Leitz PMM-C Infinity Measuring range in mm: X = 1200, Y = 1000, Z = 700 Volumetric length measuring error: E = 0.3 + L / 1000 [μm] Volumetric probing error: P = 0.4 μm Resolution: 0.004 μm Continuous High Speed Scanning Probe head LSP-S4 ULF - probing force : 2g – 16g -max. Styli weight : 1000g -max. Styli extension : 800mm -max. Probing frequency: 20pts/min -max Moving speed: 300 mm/sec -max. Acceleration: 1500 mm/sec² Continuous Scanning Probe head LSP-S4 ANF - probing force : 1g – 6g -max. Styli weight : 450g -max. Styli extension : 500mm -max. Probing frequency: 6 – 8 pts/min -max Moving speed: 80 mm/sec -max. Acceleration: 100 mm/sec² UPMC CARRAT ULTRA Measuring range in mm: X = 1150, Y = 850, Z = 600 Volumetric length measuring error: E = 0.4 + L / 1000 [μm] Volumetric probing error: P = 0.5 μm - mini. probing force : 5g

3. 3 Metrology news 02.12.2009S. Atieh RF structure development meeting UPMC CARRAT ULTRA Probing mark - mini. probing force : 5g

4. Observations TRIMEK Metrology news Non conform to CERN’s specification t ≤ 100 nm 02.12.20094S. Atieh RF structure development meeting

5. KEK metrology ZEISS 社製 UPMC-850 CARAT Probing force 5 g φ83.5 μm, depth 1.91 μm Metrology news Probing depth on discs with and without annealing Toshiyasu Higo 02.12.20095S. Atieh RF structure development meeting

6. Qualification 02.12.20096S. Atieh RF structure development meeting Damped disc CLIAAS110070 VTT (FI) Shape accuracy of 50 µm (Deviation due localisation errors) Very accurate and stable shape Fabricated by milling Section 4

7. Section1 02.12.20097S. Atieh RF structure development meeting Shape accuracy of 24 µm Damped disc CLIAAS110070 Heeze (NL)Qualification

8. Origins translation: X 16 µm and Z -8 µm Shape accuracy is respected ± 2.5 µm Additional tests for 2010: PETS (CLIAP11_0037) & AS disc damped HDS thick CLIAAS300062 DMP (ES)Qualification 02.12.20098S. Atieh RF structure development meeting

9. PETS (CLIAP11_0037) Shape accuracy 4.8 µm (15 µm nominal) Roughness Ra 120 -180 nm (100 nm nominal) KERN Micro- und Feinwerktechnik GmbH (DE) 02.12.20099S. Atieh RF structure development meeting Qualification

10. Witness pieces High precision diamond machining Cleaning (light etch) Diffusion bonding of couplers (H 2, 1045 °C) Cleaning couplers (degreasing) Brazing of cooling circuits, tuning (Au Cu, 1020 °C) Diffusion bonding of disk stack (H 2, 1035 °C) 3 discs / structure (metrology, SEM, spare) 1 simple disc (new) Vacuum baking (650 °C >10 d) 1 simple disc (new) 6+1 (0 state) = 7 additional discs FC or SPDT discs are required 02.12.200910S. Atieh RF structure development meeting News

11. Material / machining test matrix Kugler (DE) 02.12.2009S. Atieh RF structure development meeting11 Non conformities Different machinability behavior f (charge, th. Treatment) ↓ Surface finish↓ ↑ Degradation in diamond tools and fraction ↑ ↓ Geometrical aspects: flatness ↓ meeting withe Kugler→ material related test to done Pictures of scrap discs: procedureDocumentation SampelMaterialDimensionrough machining thermal treatment flycutting material certificate thermal treatment roughness, flatness 1OFE from KuglerD80 x 10 mmxxxxxx 2OFE from KuglerD80 x 10 mmxNo x 3old OFE from CERND80 x 10 mmxxx?xx 4old OFE from CERND80 x 10 mmxNo ? 5old OFE from CERND80 x 10 mm x by Kugler's subcontractor xx?xx 6New OFE_1 CERND85 x 10 mmxxxxxx 7New OFE_1 CERND85 x 10 mmxNo x 8New OFE_2 CERND85 x 10 mmxxxxxx 9New OFE_2 CERND85 x 10 mmxNo x 10New OFE_3 CERND85 x 10 mmxxxxxx 11New OFE_3 CERND85 x 10 mmxNo x Goals: Identify the machining problems Reproducibility The adapted th. treatment cycle and copper quality. Is CERN’s choice the best one (forged cupper or not?)

12. Roughness of 11WNSDvg1_KC (VDL) 02.12.200912S. Atieh RF structure development meeting Non conformities Nominal Ra 25 nm Actual Ra 68 nm Arithmetic roughness of an ideal roughness profile can be approximated by Ra ≈ 0.032f 2 /R (the real surface roughness is often found to be worse than the above ideal surface roughness) For the same tool nose radius we have to decrease feed per workpiece revolution 60 % of actual value (↑machining time = 1.6x more)

13. Flatness measurements inlet inspection on ref. A 13 Non conformities 02.12.2009S. Atieh RF structure development meeting

14. 14 Flatness CLIAAS110163 – CELL 22 STR1 Piece mesuree a l’etat libre Non conformities 02.12.2009S. Atieh RF structure development meeting

15. 15 Defaut de planeite : 52.4 microns 02.12.2009S. Atieh RF structure development meeting Non conformities Flatness CLIAAS110163 – CELL 22 STR1

16. After TT @1000°C 11WDSDVG1.8T CLIAAS110163 #1 Flatness before TT:  52 µm Flatness after TT: 436 µm 1602.12.2009S. Atieh RF structure development meeting Flatness CLIAAS110163 – CELL 22 STR1 Non conformities

17. CERN’ actions 02.12.2009S. Atieh RF structure development meeting17 Cell Ø80mm Re-indicate the state in the drawing Common measuring support Non conformities

18. Hybide Damped Structure (HDS) 02.12.200918S. Atieh RF structure development meeting to look ahead

19. (HDS) 02.12.200919S. Atieh RF structure development meeting to look ahead Advantageous / traditional milling-turning technics The best quality where needed Simple geometry Plug and play (alignment)

20. 02.12.200920S. Atieh RF structure development meeting