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Dec/3/2015WG2 in TTC Meeting 2015 @SLAC1 Field emission / Radiation in V.T. Kirk
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superconducting rf test facility Dec/3/2015WG2 in TTC Meeting 2015 @SLAC 2 Diagnostic tools for radiation in STF Silicon semiconductor detector HITACHI ALOKA MAR-781/-782 High/Low sensitivity type Range : 0.1 – 999.0 [μSv/h]/0.001 – 99.99 [mSv/h] Energy : 50 keV ~ 6 MeV Target : γ(<10pm), X(1pm – 10nm) Room temperature, on top plate of cryostat PIN photo diode HAMAMATSU S1223-01 Spectral response range : 320 – 1100 [nm] 2K (in liquid helium), 22/44 at each iris region MAR-781 S1223-01
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superconducting rf test facility Dec/3/2015WG2 in TTC Meeting 2015 @SLAC 3 Criteria / Guideline / Processing Criteria Exponential growth of radiation level with gradient (F.E. appearance) Concurrently, lower and lower Q-value (F.E. loaded) Cavity sometime leads to Quench (F.E. Quench) ? (F.E. relevant) Guideline Try processing In heavy F.E., when Q 0 <5x10 9 at below 20MV/m, stop the test administratively <250W for input power in the other region Processing Just repeating power rise several times (not special technique!) When the situation never changes after 10 mins., give up the power rise
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superconducting rf test facility Dec/3/2015WG2 in TTC Meeting 2015 @SLAC 4 Success or Degradation ? SuccessFailure Not evaluated
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superconducting rf test facility Dec/3/2015WG2 in TTC Meeting 2015 @SLAC 5 Success/Failure rate Definition: Success: after processing, lower X-ray, higher Q 0 and E acc Failure: after processing, higher X-ray, lower Q 0 and E acc Not evaluated: No processing or No X-ray Total samples : 41 tests (MHI-12 – MHI-30) after certification as qualified vendor Success cases : 26 Failure cases : 6 Not evaluated : 9 # of tests w/ F.E. : 32 # of tests w/o F.E. : 9
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superconducting rf test facility Dec/3/2015WG2 in TTC Meeting 2015 @SLAC 6 Cure technique for F.E. Automatic iris grinder Grinding iris region is effective technique for F.E. reduction! No iris grinding Iris grinding Manual iris grinder
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