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EE141 © Digital Integrated Circuits 2nd Introduction 1 EE5900 Advanced Algorithms for Robust VLSI CAD Dr. Shiyan Hu Office: EERC 731 shiyan@mtu.edu Adapted and modified from Digital Integrated Circuits: A Design Perspective by Jan M. Rabaey, Anantha Chandrakasan, and Borivoje Nikolic. Introduction
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EE141 © Digital Integrated Circuits 2nd Introduction Class Time and Office Hour Class Time: MWF 14:05-14:55 (EERC 216) Office Hours: MWF 15:00-15:50 or by appointment, office: EERC 731 Textbook (suggested): Handbook of Algorithms for Physical Design Automation, Charles J. Alpert, Dinesh P. Mehta, Sachin S. Sapatnekar, CRC Press, 2008. Grading: Homework 35% Exams 50% Project 15% 2
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EE141 © Digital Integrated Circuits 2nd Introduction Course Website http://www.ece.mtu.edu/faculty/shiyan/EE5900Spring09.htm Contact information of instructor Email: shiyan@mtu.edushiyan@mtu.edu EERC 731 Instructor’s webpage: http://www.ece.mtu.edu/faculty/shiyanhttp://www.ece.mtu.edu/faculty/shiyan 3
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EE141 © Digital Integrated Circuits 2nd Introduction 4 VLSI Design Introduction: Issues in digital integrated circuit (IC) design Device: MOS Transistors Wire: R, L and C Fabrication process CMOS inverter Combinational logic structures Sequential logic gates Timing/power optimizations on gate and interconnect Design methodologies
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EE141 © Digital Integrated Circuits 2nd Introduction 5 Introduction Why is designing digital ICs different today than it was before? What is the challenge?
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EE141 © Digital Integrated Circuits 2nd Introduction The Transistor Revolution First transistor Bell Labs, 1948
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EE141 © Digital Integrated Circuits 2nd Introduction The First Integrated Circuit First IC Jack Kilby Texas Instruments 1958
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EE141 © Digital Integrated Circuits 2nd Introduction 8 Intel 4004 Micro-Processor Intel 4004 Micro-Processor 1971 1000 transistors 1 MHz operation
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EE141 © Digital Integrated Circuits 2nd Introduction Intel 8080 Micro-Processor 1974 4500 transistors
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EE141 © Digital Integrated Circuits 2nd Introduction 10 Intel Pentium (IV) microprocessor 2000 42 million transistors 1.5 GHz
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EE141 © Digital Integrated Circuits 2nd Introduction 11 Moore’s Law lIn 1965, Gordon Moore noted that the number of transistors on a chip doubled every 18 to 24 months. lHe made a prediction that semiconductor technology will double its effectiveness every 18 months
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EE141 © Digital Integrated Circuits 2nd Introduction 12 Moore’s Law Electronics, April 19, 1965.
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EE141 © Digital Integrated Circuits 2nd Introduction 13 Transistor Counts 1,000,000 100,000 10,000 1,000 10 100 1 19751980198519901995200020052010 8086 80286 i386 i486 Pentium ® Pentium ® Pro K 1 Billion Transistors Source: Intel Projected Pentium ® II Pentium ® III Courtesy, Intel
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EE141 © Digital Integrated Circuits 2nd Introduction 14 ITRS Prediction
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EE141 © Digital Integrated Circuits 2nd Introduction 15 Moore’s law in Microprocessors 4004 8008 8080 8085 8086 286 386 486 Pentium® proc P6 0.001 0.01 0.1 1 10 100 1000 19701980199020002010 Year Transistors (MT) 2X growth in 1.96 years! Transistors on Lead Microprocessors double every 2 years Courtesy, Intel
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EE141 © Digital Integrated Circuits 2nd Introduction 16 Frequency P6 Pentium ® proc 486 386 286 8086 8085 8080 8008 4004 0.1 1 10 100 1000 10000 19701980199020002010 Year Frequency (Mhz) Lead Microprocessors frequency doubles every 2 years Doubles every 2 years Courtesy, Intel
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EE141 © Digital Integrated Circuits 2nd Introduction 17 Power Dissipation P6 Pentium ® proc 486 386 286 8086 8085 8080 8008 4004 0.1 1 10 100 197119741978198519922000 Year Power (Watts) Lead Microprocessors power continues to increase Courtesy, Intel
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EE141 © Digital Integrated Circuits 2nd Introduction 18 Power is a major problem 5KW 18KW 1.5KW 500W 4004 8008 8080 8085 8086 286 386 486 Pentium® proc 0.1 1 10 100 1000 10000 100000 19711974197819851992200020042008 Year Power (Watts) Power delivery and dissipation will be prohibitive Courtesy, Intel
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EE141 © Digital Integrated Circuits 2nd Introduction 19 Power density 4004 8008 8080 8085 8086 286 386 486 Pentium® proc P6 1 10 100 1000 10000 19701980199020002010 Year Power Density (W/cm2) Hot Plate Nuclear Reactor Rocket Nozzle Power density too high to keep junctions at low temp Courtesy, Intel
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EE141 © Digital Integrated Circuits 2nd Introduction 20 Not Only Microprocessors Digital Cellular Market (Phones Shipped) 1996 1997 1998 1999 2000 Units 48M 86M 162M 260M 435M Analog Baseband Digital Baseband (DSP + MCU ) Power Management Small Signal RF Power RF (data from Texas Instruments) Cell Phone
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EE141 © Digital Integrated Circuits 2nd Introduction 21 Many Chips
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EE141 © Digital Integrated Circuits 2nd Introduction 22 Challenges in Digital Design Ultra-high speed design Interconnect delay and noise Reliability, Manufacturability Power Dissipation Time to market
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EE141 © Digital Integrated Circuits 2nd Introduction 23 Productivity Trends 1 10 100 1,000 10,000 100,000 1,000,000 10,000,000 200319811983198519871989199119931995199719992001200520072009 10 100 1,000 10,000 100,000 1,000,000 10,000,000 100,000,000 Logic Tr./Chip Tr./Staff Month. x x x x x x x 21%/Yr. compound Productivity growth rate x 58%/Yr. compounded Complexity growth rate 10,000 1,000 100 10 1 0.1 0.01 0.001 Logic Transistor per Chip (M) 0.01 0.1 1 10 100 1,000 10,000 100,000 Productivity (K) Trans./Staff - Mo. Source: Sematech Complexity outpaces design productivity Complexity Courtesy, ITRS Roadmap
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EE141 © Digital Integrated Circuits 2nd Introduction 24 Why Scaling? Technology shrinks by 0.7 per generation With every generation can integrate 2x more functions per chip Chip price does not increase significantly Cost of a function decreases by 2x Great need for ultra-fast design methods Design Automation (Computer-Aided Design)
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EE141 © Digital Integrated Circuits 2nd Introduction 25 Design Abstraction Enables CAD n+ S G D + DEVICE CIRCUIT GATE MODULE SYSTEM
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EE141 © Digital Integrated Circuits 2nd Introduction 26 Design Metrics How to evaluate performance of a digital circuit (gate, block, …)? Speed (delay, operating frequency) Power dissipation Cost –Design time –Design effort Reliability –Process, voltage and temperature variations
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EE141 © Digital Integrated Circuits 2nd Introduction 27 Die Cost Single die Wafer From http://www.amd.com Going up to 12” (30cm)
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EE141 © Digital Integrated Circuits 2nd Introduction 28 Yield
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EE141 © Digital Integrated Circuits 2nd Introduction 29 Defects is approximately 3 in the current fabrication process About 0.5-1 defect per cm 2.
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EE141 © Digital Integrated Circuits 2nd Introduction 30 Some Examples (1994) ChipMetal layers Line width Wafer cost Def./ cm 2 Area mm 2 Dies/ wafer YieldDie cost 386DX 20.90$9001.04336071%$4 486 DX2 30.80$12001.08118154%$12 Power PC 601 40.80$17001.312111528%$53 HP PA 7100 30.80$13001.01966627%$73 DEC Alpha 30.70$15001.22345319%$149 Super Sparc 30.70$17001.62564813%$272 Pentium 30.80$15001.5296409%$417
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EE141 © Digital Integrated Circuits 2nd Introduction 31 Summary Digital integrated circuit design faces huge challenges for the coming decades High speed Low power Short design time for highly complex circuit having 1 billion transistors Reliable under noise and variations
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