1. Delay-Fault Testing Tutorial Acknowledgement: This presentation is adapted from Professor Janak Patel’s tutorial on the same topic available on the web at: http://courses.ece.uiuc.edu/ece543/docs/DelayFault_6_per_page.pdf

2. Delay Fault Testing Tutorial2 Outline Common Fault Models (Review) Defects and Delay Faults Delay Fault Models Transition Faults Path Delay Faults –Robust Path Test –Non-robust Path Test

3. Delay Fault Testing Tutorial3 Common Fault Models

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16. Delay Fault Testing Tutorial16 Only if no other path delay is increased.

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23. Delay Fault Testing Tutorial23 Exercise Consider the 4-Nand implementation of the XOR gate in the previous slide. There are six I/O paths hence 12 path delay faults. For each of these faults, determine if it is robustly testable, only non-robustly testable or not testable (functionally redundant). Provide justification for your answers.

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26. Delay Fault Testing Tutorial26 Broadside is also called launch-off-capture test. Skewed-Load is also called launch-off-shift test.

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29. Delay Fault Testing Tutorial29 Timing for launch-off-capture Transition-delay fault testing IC: Initialization Clock LC: Launch Clock CC: Capture Clock SEN: Scan Enable This figure is borrowed from the paper, Ahmed et al., ITC-2005, Paper 11.1

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31. Delay Fault Testing Tutorial31 Timing for launch-off-shift Transition-delay fault testing IC: Initialization Clock LC: Launch Clock CC: Capture Clock SEN: Scan Enable This figure is borrowed from the paper, Ahmed et al., ITC-2005, Paper 11.1

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34. Delay Fault Testing Tutorial34 ( See Prof. Patel’s website for details on Segment Test)

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