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W ORST -C ASE N OISE A REA P REDICTION OF O N -C HIP P OWER D ISTRIBUTION N ETWORK Xiang Zhang 1, Jingwei Lu 2, Yang Liu 3 and Chung-Kuan Cheng 1,2 1 ECE Dept., University of California, San Diego, CA, USA 2 CSE Dept., University of California, San Diego, CA, USA 3 Institute of Electronic CAD, Xidian University, Xi’an, China 2014-06-01 1
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E XECUTIVE S UMMARY Problem: Previous works focus on the worst-peak droop to sign off PDN. Worst-peak noise ≠ Worst timing (delay) Our goal: To predict a PDN noise for better timing sign off. Observation: The noise area of PDN => Behavior of circuit delay Case study: Design the worst-case PDN noise area Provide analytical solution for a lumped PDN model Design an algorithm for general PDN cases Results: Worst-area noise introduces 1.8% additional propagation delay compared to worst-peak noise from our empirical validation under a complete PDN path. 2
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P OWER D ISTRIBUTION N ETWORK (PDN) Power supply noise Resistive IR drop Inductive Ldi/dt noise PDN model 3
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M OTIVATION Performance sensitivity on PDN voltage drop Increased signal delay [Saint-Laurent’04] [Jiang’99] Clock jitter [Pialis’03] Delay vs supply voltage(courtesy of [Saint-Laurent’04]) 4
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PDN N OISE A REA VS D ELAY Delay is measured under a modified C432 of ISCAS85 circuit in 130nm node 5
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P ROBLEM F ORMULATION PDN Characterization Impulse Response h(t) Voltage Noise: Input to PDN system Transient load current demand i(t) Assumption: All on-die loads lumped into a single load Total current is bounded 6
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P ROBLEM F ORMULATION 7
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P ROBLEM S IMPLIFICATION 8
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S IMPLIFIED P ROBLEM F ORMULATION 9
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C ASE S TUDY : RLC T ANK M ODEL 10
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W ORST N OISE A REA P REDICTION FOR RLC T ANK 11
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C ASE S TUDY : W ORST N OISE A REA P REDICTION FOR G ENERAL PDN C ASES 12
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I NTUITION 13
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A LGORITHM D ESIGN 14
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C OMPLEXITY A NALYSIS Our algorithm consists of finite operations Step response transformation Linear scan for peaks & valleys extraction Worst-case current construction Overall complexity is O(n) Finite amount of operations Each operation consumes no larger than linear runtime 15
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E XPERIMENTAL D ESIGN AND R ESULTS Setup: Matlab R2013a HSPICE D-2013.03-SP1 Cadence Allegro Sigrity Power SI 16.6 Ansoft Q3D 12.0 ISCAS85 circuit under 0.13um cell lib Intel i7 Qual-Core 3.4GHz w/16GB PCDDR3 PDN test cases Single RLC tank Cascaded RLC tanks A complete PDN path extracted from industrial design 16
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W ORST -P EAK AND W ORST -A REA N OISE OF A S INGLE RLC T ANK C ASE 17
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W ORST -A REA AND W ORST -P EAK N OISE OF M ULTI -S TAGE C ASCADED RLC T ANKS Circuit Model Three Cases Case I can be approximated to three single RLC tanks: 18
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W ORST -A REA AND W ORST -P EAK N OISES OF M ULTI -S TAGE C ASCADED RLC T ANKS 19
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W ORST -P EAK AND W ORST -A REA N OISE OF A C OMPLETE PDN P ATH Impedance Profile: 20
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W ORST -P EAK AND W ORST -A REA N OISE OF A C OMPLETE PDN P ATH 21
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D ELAY M EASUREMENT OF A C OMPLETE PDN P ATH Send input pulse every 100ps and record delay of the datapath at the output port of C432 (ISCAS85) case Compare the delay under worst-peak and worst-area noise Results: 22
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C ONCLUSIONS Problem: Previous works focus on the worst-peak droop to sign off PDN. Worst-peak noise ≠ Worst timing (delay) Our goal: To predict a PDN noise for better timing sign off. Observation: The noise area of PDN => Behavior of circuit delay Case study: Design the worst-case PDN noise area Provide analytical solution for a lumped PDN model Design an algorithm for general PDN cases Results: Worst-area noise introduces 1.8% additional propagation delay compared to worst-peak noise from our empirical validation under a complete PDN path. 23
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Q & A 24
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D ELAY M EASUREMENT OF S INGLE RLC T ANK C ASE Send input pulse every 100ps and record delay of the datapath at the output port of C432 (ISCAS85) case 26
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