1. Spectrograph focal plane 2003 Goals : CCD l Improved CCD Cryostat connections, decoupling, preamp box photodiodes for efficiency monitoring thermistances heating resistors l Implement Megacam Readout l Test LBL CCD with Megacam card l Evaluate LBL CCD for spectrograph -Noise, frame transfer performance, temperature sensitivity -Confirmation of the test bench design. -Intrapixel variation with point source l Optical test bench: all orders placed

2. Spectrograph focal plane 2003 Goals : IR pixels l Visits to Rockwell/Raytheon (December 2002) l Select and order engineering grade detector l Design and build IR cryostat (Start February 2003) l Prepare cryogenic test card (Start February 2003) l Prepare DAQ and slow control test cards l Complete IR test bench (Sources)

3. Spectrograph focal plane 2003 Goals Main points to be clarified with firms for IR l Noise, dark current l Operating temperature for DK current < 0.02e/s/pixel l Cold preamp ? l Mechanical and thermal stress specifications l Radiation hardness (confirm 15krad), mechanical resilience (launch) l Layout l Pixel multiplicity/cosmic ray (beam test useful) l Achieved wavelength cutoffs l Time scale for a cutoff at smaller values ( 1.7 to 2 microns) l Schedule/deliveries

4. Spectrograph focal plane LPNHE Test Cryostat -Megacam connector (outside)

5. Spectrograph focal plane LPNHE Test Cryostat (inside)

6. Spectrograph focal plane IR test bench acquisition scheme

7. Spectrograph focal plane Under study (2003) l Readout scheme/spectro frame transfer, noise/frequency… IR sampling method, subtraction algorithms l Exposure time Dependent on actual noise, pixel size (via the cosmic ray rate) and mission optimisation (total exposure) specifications will be reevaluated accordingly 18 micron pixels  shorter times (occupancy)  larger sensitivity to RO noise l Operating temperature (detector performance/cutoff) l Specifications (according to results)

8. Spectrograph focal plane Development plan Select IR pixel test detector January 2003 Define elements on focal plane February 2003 (Detectors+slow controls, calibrations, others) Start design of IR interface cards February 2003 Start work on focal plane configuration February 2003 (visible and IR) First Focal Plane configuration April 2003 Layout of electronic cards (IR) May 2003 Tests of detectors and electronics September 2003-January 2004 Select SNAP grade pixel and CCD February 2004 Focal plane configuration Phase A January 2004 Detector test Phase A spring 2004

9. Spectrograph focal plane Manpower (2003) l Physicists E. Barrelet (100 %,detectors, electronics) R. Pain (15 %) G. Smadja (50 %, lay out, optical tests) l Engineers A. Castera (optics, tests,40 %) M. Detournay(software, 50 %) M. Dupanloup(system, microelectronics 20 %) J. F. Genat (electronics, 100 %) J. F. Huppert(software, 50 %) H. Lebbolo (electronics, 80 % R. Sefri (electronics test set-ups, 100 %) D. Vincent (coordination, 100 %) l Technicians P. Bailly, C. Evrard, A. Vallereau