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Published byAllison Nicholson Modified over 8 years ago
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Multi-anvil at the NSLS Michael Vaughan Liping Wang Jiuhua Chen Baosheng Li Carey Koleda Bill Huebsch Ken Baldwin Chris Young
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Personnel Michael Vaughan Liping Wang Jiuhua Chen Baosheng Li Carey Koleda Bill Huebsch Ken Baldwin Chris Young
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Cost breakdown Stony Brook University:$50,000 CHiPR:$160,000 NSLS:$1,440,000
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Details of SAM 85 Cell assembly for ultrasonic measurement Specimen length determined by X-radiography High Pressure x-ray Studies High P High T large volume Energy dispersive diffraction Angle dispersive diffraction Sample length Ultrasonic interferrometry
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Deformation-DIA Deformation device to operate to 12 GPa and 2000K Measure stress, strain rate, up to 50% strain First device built by Livermore (Durham)
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Rotational Drickamer Cell, Yale group
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Ideal Circle Stressed sample Lattice spacings for stressed sample Two detector strain measure tot v – h tot (111) * S 44 /2 tot (100) * (S 11 – S 12 )
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Li Li et al, 2004
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Li Li, 2003
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P mean =( kbar Stress, kbar Stress state in NaCl Max. T=500 C RT Kung et al, 2004
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Study of Molten Materials under High Pressures and Temperatures Opportunities at Synchrotron X-ray Beamlines
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Bulk Properties of Melts Viscosity Density Acoustic Velocity
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Jiuhua Chen
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open press 1.7 GPa 4.0 GPa 4.0 GPa 1300 o C Jiuhua Chen
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Ultrasonic Velocity Measurements Transducer Buffer RodSample Reflection/Transmission Interferometry Resonance Ultrasonic Spectroscopy GHz Ultrasonic Interferometry Precision ~ 10 -5 Baosheng Li
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Input Signal in Frequency and Time Domain Input Signal Frequency Amp Baosheng Li
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End of Run~3 GPa 400C Baosheng Li
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Melts Solid Baosheng Li
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Melts Solids Bi (I) Bi (III) Baosheng Li
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Material Sciences at X17B2 of NSLS Phase equilibria at high P and T (e.g., Si, Ge, Zr, Hf) Thermal equations of state (e.g., Si, Ge, Zr, Hf, Os, U) Reaction kinetics (e.g., Si melts + diamond = SiC) Strength of nano materials (Si, SiC, diamond) Rheology at high P and T (e.g., Ta) Voronin et al. (2003) Zhang et al. (2004) Phase diagram of the elemental Zr
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