1. The LEO 1420VP Compact design ideal for small and medium sized samples
Variable pressure operation at the click of a mouse
Reduced sample preparation
High performance electron optics
Special Cryo port on chamber

2. LEO 1420VP Essential Specifications
3.5nm 30kV (tungsten), 5.5nm resolution VP mode
Tungsten or optional LaB6 firing unit
Choice of solid state back scattered detectors
Magnification range 15X to 300kX
200V to 30kV accelerating voltage with automatic EHT bias
Unique Optibeam column control algorithm

3. LEO 1420VP Essential Specifications
The LEO 32 and WindowsTM 98 or optional NT4.0 operating system
6 axis manual high precision eucentric goniometer stage
Extensive annotation and measurement facilities
3072 x 2304 pixel image store with square pixels
3 built in ‘real time’ image processing modes

4. LEO 1420VP Key Features & Options
43mm x 25mm for smaller samples
Medium travel stage
Cylindrical chamber
with EDS and cryo accessory ports
User accounting software option
setting preferences for new users and monitoring resources used, ideal in a multi user environment
TIF file archive options
industry standard Zip and CD read / write / re-write
Printer options
a choice of hardcopy options to present those images at a variety of cost and quality levels

5. LEO 1420VP Key Features & Options
expanded desktop option allowing two applications to run together with the clarity of full screen imaging for both
Second monitor options
Analytical interface
the convenience of a high performance EDS system merged completely within the SEM control software
stage and SEM parameter control using rotary controls giving the SEM a more traditional feel
Multi function control panel option